High-accuracy wavefront sensing for x-ray free electron lasers

Liu, Yanwei; Seaberg, Matthew; Zhu, Diling; Krzywinski, Jacek; Seiboth, Frank; Hardin, Corey; Cocco, Daniele; Aquila, Andrew; Nagler, Bob; Lee, Hae Ja; Boutet, Sébastien; Feng, Yiping; Ding, Yuantao; Marcus, Gabriel; Sakdinawat, Anne

doi:10.1364/OPTICA.5.000967

Title: High-accuracy wavefront sensing for x-ray free electron lasers

Journal Article · Wed Aug 08 00:00:00 EDT 2018 · Optica

DOI:https://doi.org/10.1364/OPTICA.5.000967· OSTI ID:1463051

; Seaberg, Matthew; Zhu, Diling; Krzywinski, Jacek; Seiboth, Frank; Hardin, Corey; Cocco, Daniele; Aquila, Andrew; Nagler, Bob; Lee, Hae Ja; Boutet, Sébastien; Feng, Yiping; Ding, Yuantao; Marcus, Gabriel; Sakdinawat, Anne

Systematic understanding and real-time feedback capability for x-ray free electron laser (FEL) accelerator and optical components are critical for scientific experiments and instrument performance. Single-shot wavefront sensing enables characterization of the intensity and local electric field distribution at the sample plane, something that is important for understanding scientific experiments such as nonlinear studies. It can also provide feedback for alignment and tuning of the FEL beam and instrumentation optics, leading to optimal instrument performance and greater operational efficiency. A robust, sensitive, and accurate single-shot wavefront sensor for x-ray FEL beams using single grating Talbot interferometry has been developed. Experiments performed at the Linac Coherent Light Source (LCLS) demonstrate 3σ sensitivity and accuracy, both better than λ/100, retrieval of hard x-ray (λ = 0.13 nm, E = 9.5 keV) wavefronts in 3D. Exhibiting high performance from both unfocused and focused beams, the same setup can be used to systematically study the wavefront from the FEL output, beam transport optics, and endstation focusing optics. Finally, this technique can be extended for use with softer and harder x rays with modified grating configurations.

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Research Organization:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1463051

Alternate ID(s):: OSTI ID: 1462999

Report Number(s):: slac-pub-17308

Journal Information:: Optica, Journal Name: Optica Vol. 5 Journal Issue: 8; ISSN 2334-2536

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 42 works

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High-accuracy wavefront sensing for x-ray free electron lasers Liu, Yanwei; Seaberg, Matthew; Zhu, Diling Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-02772	text	January 2018
Wavefront sensing at X-ray free-electron lasers Seaberg, Matthew; Cojocaru, Ruxandra; Berujon, Sebastien Journal of Synchrotron Radiation, Vol. 26, Issue 4 https://doi.org/10.1107/s1600577519005721	journal	June 2019
Wavefront sensing at X-ray free-electron lasers Seaberg, Matthew; Cojocaru, Ruxandra; Berujon, Sebastien Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-02574	text	January 2019
Focal shift induced by source displacements and optical figure errors Manfredda, Michele; Raimondi, Lorenzo; Mahne, Nicola Journal of Synchrotron Radiation, Vol. 26, Issue 5 https://doi.org/10.1107/s1600577519010099	journal	August 2019
Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction Lee, Heemin; Shin, Jaeyong; Cho, Do Hyung Journal of Synchrotron Radiation, Vol. 27, Issue 1 https://doi.org/10.1107/s1600577519015443	journal	January 2020
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