Accurate photonic waveguide characterization using an arrayed waveguide structure

Gehl, Michael; Boynton, Nicholas; Dallo, Christina; Pomerene, Andrew; Starbuck, Andrew; Hood, Dana; Trotter, Douglas C.; Lentine, Anthony; DeRose, Christopher T.

doi:10.1364/OE.26.018082

Accurate photonic waveguide characterization using an arrayed waveguide structure

Journal Article · Wed Jun 27 00:00:00 EDT 2018 · Optics Express

DOI:https://doi.org/10.1364/OE.26.018082· OSTI ID:1457501

Gehl, Michael; Boynton, Nicholas; Dallo, Christina; Pomerene, Andrew; Starbuck, Andrew; Hood, Dana; Trotter, Douglas C.; Lentine, Anthony; DeRose, Christopher T.

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Sponsoring Organization:: USDOE

OSTI ID:: 1457501

Alternate ID(s):: OSTI ID: 1459924

Journal Information:: Optics Express, Journal Name: Optics Express Journal Issue: 14 Vol. 26; ISSN 1094-4087; ISSN OPEXFF

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

References (18)

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Method for characterization of Si waveguide propagation loss Moresco, Michele; Romagnoli, Marco; Boscolo, Stefano Optics Express, Vol. 21, Issue 5 https://doi.org/10.1364/OE.21.005391	journal	January 2013
Active phase correction of high resolution silicon photonic arrayed waveguide gratings Gehl, M.; Trotter, D.; Starbuck, A. Optics Express, Vol. 25, Issue 6 https://doi.org/10.1364/OE.25.006320	journal	January 2017
Germanium-on-silicon waveguides operating at mid-infrared wavelengths up to 85 μm Nedeljkovic, Milos; Penades, Jordi Soler; Mittal, Vinita Optics Express, Vol. 25, Issue 22 https://doi.org/10.1364/OE.25.027431	journal	January 2017
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