PIND: High spatial resolution by pinhole neutron diffraction
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Here, a pinhole neutron diffraction (PIND) technique was developed to enable improving the spatial resolution down to 250 μm. Instead of the conventional engineering diffraction method which integrates all the diffraction signals on the detector plane, the PIND setup utilizes the diffraction pattern of each pixel on 2D detectors. The proposed PIND arrangement enables improving the spatial resolution of time-of-flight instruments and allows solving problems involving steep gradients of strain or texture. The phase content and preferential orientation of grains inside samples can be spatially resolved in 2D/3D. Further, PIND retains the capability of in-situ non-destructive neutron diffraction mapping of lattice strain and grain orientation under external stimuli such as temperature and force.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC05-00OR22725; LDRD-6789
- OSTI ID:
- 1479785
- Alternate ID(s):
- OSTI ID: 1454666
- Journal Information:
- Applied Physics Letters, Vol. 112, Issue 25; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
A suite-level review of the neutron powder diffraction instruments at Oak Ridge National Laboratory
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journal | September 2018 |
Time-of-Flight Neutron Diffraction (TOF-ND) Analyses of the Composition and Minting of Ancient Judaean “Biblical” Coins
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journal | March 2019 |
Bending Behavior of a Wrought Magnesium Alloy Investigated by the In Situ Pinhole Neutron Diffraction Method
|
journal | August 2018 |
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