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Title: PIND: High spatial resolution by pinhole neutron diffraction

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.5026066· OSTI ID:1479785

Here, a pinhole neutron diffraction (PIND) technique was developed to enable improving the spatial resolution down to 250 μm. Instead of the conventional engineering diffraction method which integrates all the diffraction signals on the detector plane, the PIND setup utilizes the diffraction pattern of each pixel on 2D detectors. The proposed PIND arrangement enables improving the spatial resolution of time-of-flight instruments and allows solving problems involving steep gradients of strain or texture. The phase content and preferential orientation of grains inside samples can be spatially resolved in 2D/3D. Further, PIND retains the capability of in-situ non-destructive neutron diffraction mapping of lattice strain and grain orientation under external stimuli such as temperature and force.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC05-00OR22725; LDRD-6789
OSTI ID:
1479785
Alternate ID(s):
OSTI ID: 1454666
Journal Information:
Applied Physics Letters, Vol. 112, Issue 25; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

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Cited By (3)

A suite-level review of the neutron powder diffraction instruments at Oak Ridge National Laboratory journal September 2018
Time-of-Flight Neutron Diffraction (TOF-ND) Analyses of the Composition and Minting of Ancient Judaean “Biblical” Coins journal March 2019
Bending Behavior of a Wrought Magnesium Alloy Investigated by the In Situ Pinhole Neutron Diffraction Method journal August 2018

Figures / Tables (3)


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