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Amorphous-semiconductor-contact germanium-based detectors for gamma-ray imaging and spectroscopy

Journal Article · · Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
 [1];  [2];  [3]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Nuclear Science and Security Consortium
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  3. Univ. of California, Berkeley, CA (United States). Dept. of Physics
Germanium-based detectors are the standard technology used for gamma-ray spectroscopy when high efficiency and excellent energy resolution are desired. By dividing the electrical contacts on these detectors into segments, the locations of the gamma-ray interaction events within the detectors can be determined as well as the deposited energies. This enables simultaneous gamma-ray imaging and spectroscopy and leads to applications in the areas of astronomy, nuclear physics, environmental remediation, nuclear nonproliferation, and homeland security. Producing the fine-pitched electrode segmentation often required for imaging has been problematic in the past. To address this issue, we have developed an amorphous-semiconductor contact technology. Using this technology, fully passivated detectors with closely spaced contacts can be produced using a simple fabrication process. The current state of the amorphous-semiconductor contact technology and the challenges that remain are given in this paper.
Research Organization:
Univ. of California, Berkeley, CA (United States). Nuclear Science and Security Consortium
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation (NA-20)
DOE Contract Number:
NA0000979
OSTI ID:
1454507
Journal Information:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment Journal Issue: 2 Vol. 579; ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English

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