MapX: 2D XRF for Planetary Exploration - Image Formation and Optic Characterization

Journal Article · Sun Apr 01 00:00:00 EDT 2018 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/13/04/c04023· OSTI ID:1436443

Sarrazin, P. ^[1]; Blake, D. ^[2]; Gailhanou, M. ^[3]; Marchis, F. ^[1]; Chalumeau, C. ^[1]; Webb, S. ^[4]; Walter, P. ^[5]; Schyns, E. ^[6]; Thompson, K. ^[1]; Bristow, T. ^[2]

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1. SETI Inst., Mountain View, CA (United States)
2. NASA Ames Research Center (ARC), Moffett Field, Mountain View, CA (United States)
3. Aix-Marseille Univ., and CNRS/IN2P, Marseille (France)
4. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
5. Sorbonne Univ., Paris (France). Lab. d’Archéologie Moleculaire et Structurale (LAMS)
6. PHOTONIS France SAS, Brive (France)

Map-X is a planetary instrument concept for 2D X-Ray Fluorescence (XRF) spectroscopy. The instrument is placed directly on the surface of an object and held in a fixed position during the measurement. The formation of XRF images on the CCD detector relies on a multichannel optic configured for 1:1 imaging and can be analyzed through the point spread function (PSF) of the optic. The PSF can be directly measured using a micron-sized monochromatic X-ray source in place of the sample. Such PSF measurements were carried out at the Stanford Synchrotron and are compared with ray tracing simulations. It is shown that artifacts are introduced by the periodicity of the PSF at the channel scale and the proximity of the CCD pixel size and the optic channel size. A strategy of sub-channel random moves was used to cancel out these artifacts and provide a clean experimental PSF directly usable for XRF image deconvolution.

• Research Organization: SLAC National Accelerator Lab., Menlo Park, CA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Aeronautics and Space Administration (NASA)
• Grant/Contract Number: AC02-76SF00515
• OSTI ID: 1436443
• Journal Information: Journal of Instrumentation, Vol. 13, Issue 04; Conference: 24. International congress on x-ray optics and microanalysis , Trieste (Italy), 24-29 Sep 2017; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)
• Country of Publication: United States
• Language: English

Related Subjects

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X-ray fluorescence (XRF) systems
Optics
X-ray transport and focusing