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Title: Grips for testing of electrical characteristics of a specimen under a mechanical load

Patent ·
OSTI ID:1436307
;

Various technologies to facilitate coupled electrical and mechanical measurement of conductive materials are disclosed herein. A gripping device simultaneously holds a specimen in place and causes contact to be made between the specimen and a plurality of electrodes connected to an electrical measuring device. An electrical characteristic of the specimen is then measured while a mechanical load is applied to the specimen, and a relationship between the mechanical load and changes in the electrical characteristic can be identified.

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, MN)
Patent Number(s):
9,952,254
Application Number:
14/940,009
OSTI ID:
1436307
Resource Relation:
Patent File Date: 2015 Nov 12
Country of Publication:
United States
Language:
English

References (12)

Electrical socket for TAB IC's patent November 1990
High-magnification telephoto spectacles for age-related macular degeneration patent March 1993
Tape automated bonding test apparatus for thermal, mechanical and electrical coupling patent March 1993
Testing apparatus for semiconductor device formed on tape carrier patent May 1995
High temperature deformable crucible for use with self-resistively heated specimens patent January 1996
Clamp-on electrical measuring device patent March 1997
Heat build-up/fatigue measuring method for viscoelastic body and hydraulic servo flexometer patent September 1999
Apparatus and method for electromechanical testing and validation of probe cards patent June 2005
Thermal-mechanical testing apparatus for electrically conductive specimen testing systems and method for use thereof patent January 2017
Technique for applying direct resistance heating current to a specific location in a specimen under test while substantially reducing thermal gradients in the specimen gauge length patent-application August 2006
Thermal-Mechanical Testing Apparatus for Electrically Conductive Specimen Testing Systems and Method for Use Thereof patent-application May 2014
System for the Combined, Probe-Based Mechanical and Electrical Testing of MEMS patent-application July 2015

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