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Title: Multi-slice ptychography with large numerical aperture multilayer Laue lenses

Journal Article · · Optica

Here, the highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0012704; LDRD-21690
OSTI ID:
1436220
Alternate ID(s):
OSTI ID: 1437944
Report Number(s):
BNL-204651-2018-JAAM
Journal Information:
Optica, Journal Name: Optica Vol. 5 Journal Issue: 5; ISSN 2334-2536
Publisher:
Optical Society of AmericaCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 35 works
Citation information provided by
Web of Science

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Cited By (8)

Coupled ptychography and tomography algorithm improves reconstruction of experimental data journal January 2019
Coupled ptychography and tomography algorithm improves reconstruction of experimental data text January 2019
X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects journal January 2020
X-ray ptychography on low-dimensional hard-condensed matter materials journal March 2019
The Velociprobe: An ultrafast hard X-ray nanoprobe for high-resolution ptychographic imaging journal August 2019
Overcoming the challenges of high-energy X-ray ptychography journal July 2019
Resolving 500 nm axial separation by multi-slice X-ray ptychography journal February 2019
Three-dimensional space optimization for near-field ptychography journal January 2019


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