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Title: A first principles study of commonly observed planar defects in Ti/TiB system

Journal Article · · Computational Materials Science

Here, TiB exhibits a hexagonal cross-section with growth faults on (1 0 0) planes and contains B27-Bf bicrystals. The hexagonal cross-section is presently explained by surface free energy minimization principle. We show that interfacial energy calculations explain the longer (1 0 0) facet compared to (1 0 1) type facets whereas free surface energy arguments do not provide the true picture. No quantitative explanation of stacking faults and B27-Bf interfaces in TiB exists. We show that the low formation energy of stacking faults and B27-Bf interfaces explain their abundance. The low energy barrier for Bf formation is shown to be responsible for their presence in TiB.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1435320
Alternate ID(s):
OSTI ID: 1778328
Journal Information:
Computational Materials Science, Vol. 150, Issue C; ISSN 0927-0256
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 15 works
Citation information provided by
Web of Science

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Cited By (2)

Regulation of the Interface Binding and Elastic Properties of SiC/Ti via Doping‐Induced Electronic Localization journal September 2019
Strain induced additional growth and high integrity of TiB-whiskers in titanium matrix composite: intrinsic mechanisms and superior strengthening effects journal November 2019

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