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Title: Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser

Abstract

X-ray free-electron lasers (XFELs) provide extremely bright and highly spatially coherent x-ray radiation with femtosecond pulse duration. Currently, they are widely used in biology and material science. Knowledge of the XFEL statistical properties during an experiment may be vitally important for the accurate interpretation of the results. Here, for the first time, we demonstrate Hanbury Brown and Twiss (HBT) interferometry performed in diffraction mode at an XFEL source. It allowed us to determine the XFEL statistical properties directly from the Bragg peaks originating from colloidal crystals. This approach is different from the traditional one when HBT interferometry is performed in the direct beam without a sample. Our analysis has demonstrated nearly full (80%) global spatial coherence of the XFEL pulses and an average pulse duration on the order of ten femtoseconds for the monochromatized beam, which is significantly shorter than expected from the electron bunch measurements.

Authors:
ORCiD logo [1];  [1]; ORCiD logo [2];  [3];  [3];  [3];  [1]; ORCiD logo [4];  [3];  [3]; ORCiD logo [3]; ORCiD logo [1]; ORCiD logo [5];  [6];  [7]; ORCiD logo [8]
  1. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); National Research Tomsk Polytechnic Univ. (TPU), Tomsk (Russian Federation)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Utrecht Univ. (Netherlands). Van‘t Hoff Lab. for Physical and Colloid Chemistry. Debye Inst. for Nanomaterial Science
  5. European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
  6. Univ. of California, San Diego, CA (United States)
  7. Utrecht Univ. (Netherlands). Van‘t Hoff Lab. for Physical and Colloid Chemistry. Debye Inst. for Nanomaterial Science; Eindhoven Univ. of Technology (Netherlands). Lab. of Physical Chemistry. Dept. of Chemical Engineering and Chemistry
  8. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); National Research Nuclear Univ. MEPhI (Moscow Engineering Physics Inst.), Moscow (Russian Federation)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); Helmholtz Association (Germany)
OSTI Identifier:
1433978
Report Number(s):
BNL-203514-2018-JAAM
Journal ID: ISSN 2045-2322
Grant/Contract Number:
AC02-76SF00515
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 8; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; free-electron lasers; quantum optics; x-rays

Citation Formats

Gorobtsov, O. Yu., Mukharamova, N., Lazarev, S., Chollet, M., Zhu, D., Feng, Y., Kurta, R. P., Meijer, J. -M., Williams, G., Sikorski, M., Song, S., Dzhigaev, D., Serkez, S., Singer, A., Petukhov, A. V., and Vartanyants, I. A. Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser. United States: N. p., 2018. Web. doi:10.1038/s41598-018-19793-1.
Gorobtsov, O. Yu., Mukharamova, N., Lazarev, S., Chollet, M., Zhu, D., Feng, Y., Kurta, R. P., Meijer, J. -M., Williams, G., Sikorski, M., Song, S., Dzhigaev, D., Serkez, S., Singer, A., Petukhov, A. V., & Vartanyants, I. A. Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser. United States. doi:10.1038/s41598-018-19793-1.
Gorobtsov, O. Yu., Mukharamova, N., Lazarev, S., Chollet, M., Zhu, D., Feng, Y., Kurta, R. P., Meijer, J. -M., Williams, G., Sikorski, M., Song, S., Dzhigaev, D., Serkez, S., Singer, A., Petukhov, A. V., and Vartanyants, I. A. Fri . "Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser". United States. doi:10.1038/s41598-018-19793-1. https://www.osti.gov/servlets/purl/1433978.
@article{osti_1433978,
title = {Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser},
author = {Gorobtsov, O. Yu. and Mukharamova, N. and Lazarev, S. and Chollet, M. and Zhu, D. and Feng, Y. and Kurta, R. P. and Meijer, J. -M. and Williams, G. and Sikorski, M. and Song, S. and Dzhigaev, D. and Serkez, S. and Singer, A. and Petukhov, A. V. and Vartanyants, I. A.},
abstractNote = {X-ray free-electron lasers (XFELs) provide extremely bright and highly spatially coherent x-ray radiation with femtosecond pulse duration. Currently, they are widely used in biology and material science. Knowledge of the XFEL statistical properties during an experiment may be vitally important for the accurate interpretation of the results. Here, for the first time, we demonstrate Hanbury Brown and Twiss (HBT) interferometry performed in diffraction mode at an XFEL source. It allowed us to determine the XFEL statistical properties directly from the Bragg peaks originating from colloidal crystals. This approach is different from the traditional one when HBT interferometry is performed in the direct beam without a sample. Our analysis has demonstrated nearly full (80%) global spatial coherence of the XFEL pulses and an average pulse duration on the order of ten femtoseconds for the monochromatized beam, which is significantly shorter than expected from the electron bunch measurements.},
doi = {10.1038/s41598-018-19793-1},
journal = {Scientific Reports},
number = ,
volume = 8,
place = {United States},
year = {Fri Feb 02 00:00:00 EST 2018},
month = {Fri Feb 02 00:00:00 EST 2018}
}

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