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Title: Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser

Journal Article · · Scientific Reports
ORCiD logo [1];  [1]; ORCiD logo [2];  [3];  [3];  [3];  [1]; ORCiD logo [4];  [3];  [3]; ORCiD logo [3]; ORCiD logo [1]; ORCiD logo [5];  [6];  [7]; ORCiD logo [8]
  1. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); National Research Tomsk Polytechnic Univ. (TPU), Tomsk (Russian Federation)
  3. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  4. Utrecht Univ. (Netherlands). Van‘t Hoff Lab. for Physical and Colloid Chemistry. Debye Inst. for Nanomaterial Science
  5. European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
  6. Univ. of California, San Diego, CA (United States)
  7. Utrecht Univ. (Netherlands). Van‘t Hoff Lab. for Physical and Colloid Chemistry. Debye Inst. for Nanomaterial Science; Eindhoven Univ. of Technology (Netherlands). Lab. of Physical Chemistry. Dept. of Chemical Engineering and Chemistry
  8. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); National Research Nuclear Univ. MEPhI (Moscow Engineering Physics Inst.), Moscow (Russian Federation)

X-ray free-electron lasers (XFELs) provide extremely bright and highly spatially coherent x-ray radiation with femtosecond pulse duration. Currently, they are widely used in biology and material science. Knowledge of the XFEL statistical properties during an experiment may be vitally important for the accurate interpretation of the results. Here, for the first time, we demonstrate Hanbury Brown and Twiss (HBT) interferometry performed in diffraction mode at an XFEL source. It allowed us to determine the XFEL statistical properties directly from the Bragg peaks originating from colloidal crystals. This approach is different from the traditional one when HBT interferometry is performed in the direct beam without a sample. Our analysis has demonstrated nearly full (80%) global spatial coherence of the XFEL pulses and an average pulse duration on the order of ten femtoseconds for the monochromatized beam, which is significantly shorter than expected from the electron bunch measurements.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Helmholtz Association (Germany)
Grant/Contract Number:
AC02-76SF00515
OSTI ID:
1433978
Report Number(s):
BNL-203514-2018-JAAM
Journal Information:
Scientific Reports, Vol. 8; ISSN 2045-2322
Publisher:
Nature Publishing GroupCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 12 works
Citation information provided by
Web of Science

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Cited By (5)

On-line monitoring of the spatial properties of hard X-ray free-electron lasers based on a grating splitter journal April 2019
Ghost Imaging at an XUV Free-Electron Laser text January 2018
Ghost imaging at an XUV free-electron laser text January 2020
Coherence properties of the high-energy fourth-generation X-ray synchrotron sources text January 2019
Coherence properties of the high-energy fourth-generation X-ray synchrotron sources text January 2019

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