Introduction to Photovoltaics Failure Analysis and Reliability.
Journal Article
·
· Electronic Device and Failure Analysis
OSTI ID:1426870
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Photovoltaics (PV) are becoming an increasingly important solution to meet the demand for renewable energy. The rapid growth and adoption of this technology means that microelectronics failure analysis and reliability experts may be called upon to address current and future challenges. The article here provides a brief primer on common failure mechanisms found in PV component devices, as well as the associated failure analysis techniques to identify them.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1426870
- Report Number(s):
- SAND--2014-19711J; 642744
- Journal Information:
- Electronic Device and Failure Analysis, Journal Name: Electronic Device and Failure Analysis Journal Issue: 1 Vol. 17; ISSN 1537-0755
- Publisher:
- ASM International
- Country of Publication:
- United States
- Language:
- English
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