skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Point defect production, geometry and stability in silicon: A molecular dynamics simulation study

Conference ·
OSTI ID:142553
;  [1];  [2]
  1. Lawrence Livermore National Lab., CA (United States)
  2. AT and T Bell Labs., Murray Hill, NJ (United States)

We present results of molecular dynamics computer simulation studies of the threshold energy for point defect production in silicon. We employ computational cells with 8000 atoms at ambient temperature of 10 K that interact via the Stillinger-Weber potential. Our simulations address the orientation dependence of the defect production threshold as well as the structure and stability of the resulting vacancy-interstitial pairs. Near the <111> directions, a vacancy tetrahedral-interstitial pair is produced for 25 eV recoils. However, at 30 eV recoil energy, the resulting interstitial is found to be the <110> split dumbbell configuration. This Frenkel pair configuration is lower in energy than the former by 1.2 eV. Moreover, upon warming of the sample from 10 K the tetrahedral interstitial converts to a <110> split before finally recombining with the vacancy. Along <100> directions, a vacancy-<110> split interstitial configuration is found at the threshold energy of 22 eV. Near <110> directions, a wide variety of closed replacement chains are found to occur for recoil energies up to 45 eV. At 45 eV, the low energy vacancy- split configuration is found. At 300 K, the results are similar. We provide details on the atomic structure and relaxations near these defects as well as on their mobilities.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
142553
Report Number(s):
UCRL-JC-116364; CONF-931108-92; ON: DE94008292
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 29 Nov - 3 Dec 1993; Other Information: PBD: Feb 1994
Country of Publication:
United States
Language:
English

Similar Records

Correlation between self-diffusion in Si and the migration mechanisms of vacancies and self-interstitials: An atomistic study
Journal Article · Tue Jul 01 00:00:00 EDT 2008 · Physical Review. B, Condensed Matter, 78:035208 · OSTI ID:142553

Near-threshold displacements in tantalum single crystals
Journal Article · Mon Jan 15 00:00:00 EST 1979 · Phys. Rev., Sect. B. Condens. Matter; (United States) · OSTI ID:142553

Molecular dynamics studies of silicon ion implantation
Conference · Sat Dec 31 00:00:00 EST 1994 · OSTI ID:142553