Open Secondary Testing of Window-Type Current Transformers

Technical Report · Mon May 01 00:00:00 EDT 2017

DOI:https://doi.org/10.2172/1425116· OSTI ID:1425116

Subudhi, M. ^[1]; Joshi, Piyush ^[1]; Dimaiuta, S. ^[1]; Gunther, W. ^[1]

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1. Brookhaven National Laboratory (BNL), Upton, NY (United States)

Two AMRAN Current Transformers (CTs) were tested to characterize the propensity of an opencircuited CT secondary to cause a fire in a location remote to the open circuit. Also evaluated was the magnitude of the secondary winding peak (crest) voltage when the CT’s secondary circuit transitioned to an open circuit condition, and its dependencies on the primary voltage, primary current and the CT’s turn ratio.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Nuclear Physics (NP)
• DOE Contract Number: SC0012704
• OSTI ID: 1425116
• Report Number(s): BNL-203314-2018-INRE
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS