Invited Article: Narrowband terahertz bandpass filters employing stacked bilayer metasurface antireflection structures

Chang, Chun-Chieh; Huang, Li; Nogan, John; Chen, Hou-Tong

doi:10.1063/1.5003984

Invited Article: Narrowband terahertz bandpass filters employing stacked bilayer metasurface antireflection structures

Journal Article · Thu Feb 01 00:00:00 EST 2018 · APL Photonics

DOI:https://doi.org/10.1063/1.5003984· OSTI ID:1423978

^[1]; Huang, Li ^[2]; Nogan, John ^[3]; ^[1]

Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Harbin Inst. of Technology (China)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

We experimentally demonstrate high-performance narrowband terahertz (THz) bandpass filters through cascading multiple bilayer metasurface antireflection structures. Each bilayer metasurface, consisting of a square array of silicon pillars with a self-aligned top gold resonator-array and a complementary bottom gold slot-array, enables near-zero reflection and simultaneously close-to-unity single-band transmission at designed operational frequencies in the THz spectral region. The THz bandpass filters based on stacked bilayer metasurfaces allow a fairly narrow, high-transmission passband, and a fast roll-off to an extremely clean background outside the passband, thereby providing superior bandpass performance. The demonstrated scheme of narrowband THz bandpass filtering is of great importance for a variety of applications where spectrally clean, high THz transmission over a narrow bandwidth is desired, such as THz spectroscopy and imaging, molecular detection and monitoring, security screening, and THz wireless communications.

View Accepted Manuscript (DOE)

Research Organization:: Los Alamos National Laboratory (LANL)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC52-06NA25396

OSTI ID:: 1423978

Alternate ID(s):: OSTI ID: 1419699

Report Number(s):: LA-UR-17-28324

Journal Information:: APL Photonics, Journal Name: APL Photonics Journal Issue: 5 Vol. 3; ISSN 2378-0967

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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