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Title: Energy density engineering via zero-admittance domains in all-dielectric stratified materials

Abstract

Emerging photonic, sensing, and quantum applications require high fields and tight localization but low power consumption. Spatial, spectral, and magnitude control of electromagnetic fields is of key importance for enabling experiments in atomic, molecular, and optical physics. Here in this paper, we introduce the concept of zero-admittance domains as a mechanism for tailoring giant optical fields bound within or on the surface of dielectric media. The described mechanism permits the creation of highly localized fields of extreme amplitudes simultaneously for incident photons of multiple wavelengths and incidence angles but arbitrary polarization states. No material constraints are placed upon the bounding media. Both intrinsic and extrinsic potential practical limitations of the predicted field enhancement are analyzed and applications relevant to optical sensors and microsources are briefly discussed.

Authors:
 [1];  [1];  [1];  [1];  [2];  [3];  [1]
  1. Aix-Marseille Univ., and CNRS, Marseille (France). Inst. Fresnel
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Quantum Information Science (QIS)
  3. City Univ. of Hong Kong (China). Center Of Super-Diamond and Advanced Films (COSDAF) and Dept. of Materials Science and Engineering
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1422793
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Physical Review A
Additional Journal Information:
Journal Volume: 97; Journal Issue: 2; Journal ID: ISSN 2469-9926
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING

Citation Formats

Amra, Claude, Zerrad, Myriam, Lemarchand, Fabien, Lereu, Aude, Passian, Ali, Zapien, Juan Antonio, and Lequime, Michel. Energy density engineering via zero-admittance domains in all-dielectric stratified materials. United States: N. p., 2018. Web. doi:10.1103/PhysRevA.97.023819.
Amra, Claude, Zerrad, Myriam, Lemarchand, Fabien, Lereu, Aude, Passian, Ali, Zapien, Juan Antonio, & Lequime, Michel. Energy density engineering via zero-admittance domains in all-dielectric stratified materials. United States. doi:10.1103/PhysRevA.97.023819.
Amra, Claude, Zerrad, Myriam, Lemarchand, Fabien, Lereu, Aude, Passian, Ali, Zapien, Juan Antonio, and Lequime, Michel. Mon . "Energy density engineering via zero-admittance domains in all-dielectric stratified materials". United States. doi:10.1103/PhysRevA.97.023819. https://www.osti.gov/servlets/purl/1422793.
@article{osti_1422793,
title = {Energy density engineering via zero-admittance domains in all-dielectric stratified materials},
author = {Amra, Claude and Zerrad, Myriam and Lemarchand, Fabien and Lereu, Aude and Passian, Ali and Zapien, Juan Antonio and Lequime, Michel},
abstractNote = {Emerging photonic, sensing, and quantum applications require high fields and tight localization but low power consumption. Spatial, spectral, and magnitude control of electromagnetic fields is of key importance for enabling experiments in atomic, molecular, and optical physics. Here in this paper, we introduce the concept of zero-admittance domains as a mechanism for tailoring giant optical fields bound within or on the surface of dielectric media. The described mechanism permits the creation of highly localized fields of extreme amplitudes simultaneously for incident photons of multiple wavelengths and incidence angles but arbitrary polarization states. No material constraints are placed upon the bounding media. Both intrinsic and extrinsic potential practical limitations of the predicted field enhancement are analyzed and applications relevant to optical sensors and microsources are briefly discussed.},
doi = {10.1103/PhysRevA.97.023819},
journal = {Physical Review A},
issn = {2469-9926},
number = 2,
volume = 97,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 1 work
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Figures / Tables:

Fig. 1 Fig. 1: Schematic presentation of an all-dielectric planar multilayer thin film system. Geometry of design (a) and various reflection regimes as a function of the in-plane wave vector 𝜎 (b) for a free space illumination (𝜎 < 𝑘0). Light, propagating in the z direction, enters layer i with a thicknessmore » ei and a refractive index of ni. Below ks, TIR is compromised.« less

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    Works referencing / citing this record:

    Broadband, Multiband, and Multifunctional All-Dielectric Metasurfaces
    journal, May 2019


    Nanosystems, Edge Computing, and the Next Generation Computing Systems
    journal, September 2019