Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods

Wu, Zhigang; Chun, Jaehun; Chatterjee, Sayandev; Li, Dongsheng

doi:10.1002/sia.6346

Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods

Journal Article · Thu Nov 09 04:00:00 EST 2017 · Surface and Interface Analysis

DOI:https://doi.org/10.1002/sia.6346· OSTI ID:1422297

Wu, Zhigang ^[1]; ^[2]; Chatterjee, Sayandev ^[3]; ^[2]

School of Science, North University of China, Shanxi 030051 China
Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, WA USA
Energy and Environment Directorate, Pacific Northwest National Laboratory, WA USA

Detailed knowledge of the forces between nanocrystals is very crucial for understanding many generic (e.g., random aggregation/assembly and rheology) and specific (e.g., oriented attachment) phenomena at macroscopic length scales, especially considering the additional complexities involved in nanocrystals such as crystal orientation and corresponding orientation-dependent physicochemical properties. Because there are a limited number of methods to directly measure the forces, little is known about the forces that drive the various emergent phenomena. Here we report on two methods of preparing crystals as force measurement tips used in an atomic force microscope (AFM): the focused ion beam method and microlithography method. The desired crystals are fabricated using these two methods and are fixed to the AFM probe using platinum deposition, ultraviolet epoxy, or resin, which allows for the orientation-dependent force measurements. These two methods can be used to attach virtually any solid particles (from the size of a few hundreds of nanometers to millimeters). We demonstrate the force measurements between aqueous media under different conditions such as pH.

Research Organization:: Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL); Energy Frontier Research Centers (EFRC) (United States). Interfacial Dynamics in Radioactive Environments and Materials (IDREAM)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC05-76RL01830

OSTI ID:: 1422297

Report Number(s):: PNNL-SA-126666; 49686

Journal Information:: Surface and Interface Analysis, Journal Name: Surface and Interface Analysis Journal Issue: 1 Vol. 50; ISSN 0142-2421

Publisher:: Wiley

Country of Publication:: United States

Language:: English

References (24)

Perforated tips for high-resolution in-plane magnetic force microscopy Folks, L.; Best, M. E.; Rice, P. M. Applied Physics Letters, Vol. 76, Issue 7 https://doi.org/10.1063/1.125626	journal	February 2000
Resolving Fine Structures of the Electric Double Layer of Electrochemical Interfaces in Ionic Liquids with an AFM Tip Modification Strategy Zhong, Yun-Xin; Yan, Jia-Wei; Li, Mian-Gang Journal of the American Chemical Society, Vol. 136, Issue 42 https://doi.org/10.1021/ja508222m	journal	October 2014
Investigating the magnitude and source of orientation-dependent interactions between TiO ₂ crystal surfaces Li, Dongsheng; Wang, Hailong; Xiao, Dongdong Nanoscale, Vol. 9, Issue 29 https://doi.org/10.1039/C7NR03535G	journal	January 2017
Direct measurement of colloidal forces using an atomic force microscope Ducker, William A.; Senden, Tim J.; Pashley, Richard M. Nature, Vol. 353, Issue 6341 https://doi.org/10.1038/353239a0	journal	September 1991
Graphene MEMS: AFM Probe Performance Improvement Martin-Olmos, Cristina; Rasool, Haider Imad; Weiller, Bruce H. ACS Nano, Vol. 7, Issue 5 https://doi.org/10.1021/nn400557b	journal	April 2013
Effect of particle size distribution on slurry rheology: Nuclear waste simulant slurries Chun, Jaehun; Oh, Takkeun; Luna, Maria Colloids and Surfaces A: Physicochemical and Engineering Aspects, Vol. 384, Issue 1-3 https://doi.org/10.1016/j.colsurfa.2011.04.003	journal	July 2011
Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection Kageshima, Masami; Ogiso, Hisato; Nakano, Shizuka Japanese Journal of Applied Physics, Vol. 38, Issue Part 1, No. 6B https://doi.org/10.1143/JJAP.38.3958	journal	June 1999
Can Cr( iii ) substitute for Al( iii ) in the structure of boehmite? Chatterjee, Sayandev; Conroy, Michele A.; Smith, Frances N. RSC Advances, Vol. 6, Issue 109 https://doi.org/10.1039/C6RA20234A	journal	January 2016
Demonstration of an electrostatic-shielded cantilever Pingue, P.; Piazza, V.; Baschieri, P. Applied Physics Letters, Vol. 88, Issue 4 https://doi.org/10.1063/1.2168247	journal	January 2006
Effect of Different Crystal Faces on Experimental Interaction Force and Aggregation of Hematite Hiemstra, Tjisse; Van Riemsdijk, Willem H. Langmuir, Vol. 15, Issue 23 https://doi.org/10.1021/la9903604	journal	November 1999
Multiparametric high-resolution imaging of native proteins by force-distance curve–based AFM Pfreundschuh, Moritz; Martinez-Martin, David; Mulvihill, Estefania Nature Protocols, Vol. 9, Issue 5 https://doi.org/10.1038/nprot.2014.070	journal	April 2014
The Isoelectric Points of Solid Oxides, Solid Hydroxides, and Aqueous Hydroxo Complex Systems Parks, George A. Chemical Reviews, Vol. 65, Issue 2 https://doi.org/10.1021/cr60234a002	journal	April 1965
Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid Miyazawa, K.; Izumi, H.; Watanabe-Nakayama, T. Nanotechnology, Vol. 26, Issue 10 https://doi.org/10.1088/0957-4484/26/10/105707	journal	February 2015
Measurement of the Surface Free Energy of Streptavidin Crystals by Atomic Force Microscopy Relini, Annalisa; Sottini, Silvia; Zuccotti, Simone Langmuir, Vol. 19, Issue 7 https://doi.org/10.1021/la026515g	journal	April 2003
Trends in mica–mica adhesion reflect the influence of molecular details on long-range dispersion forces underlying aggregation and coalignment Li, Dongsheng; Chun, Jaehun; Xiao, Dongdong Proceedings of the National Academy of Sciences, Vol. 114, Issue 29 https://doi.org/10.1073/pnas.1621186114	journal	July 2017
Diamond-Modified AFM Probes: From Diamond Nanowires to Atomic Force Microscopy-Integrated Boron-Doped Diamond Electrodes Smirnov, Waldemar; Kriele, Armin; Hoffmann, René Analytical Chemistry, Vol. 83, Issue 12 https://doi.org/10.1021/ac200659e	journal	June 2011
Direct Force Measurements between Silica and Alumina ^§ Larson, I.; Drummond, C. J.; Chan, D. Y. C. Langmuir, Vol. 13, Issue 7 https://doi.org/10.1021/la960684h	journal	April 1997
Efficient attachment of carbon nanotubes to conventional and high-frequency AFM probes enhanced by electron beam processes Slattery, Ashley D.; Blanch, Adam J.; Quinton, Jamie S. Nanotechnology, Vol. 24, Issue 23 https://doi.org/10.1088/0957-4484/24/23/235705	journal	May 2013
Fabrication of advanced probes for atomic force microscopy using focused ion beam Ageev, O. A.; Kolomiytsev, A. S.; Bykov, A. V. Microelectronics Reliability, Vol. 55, Issue 9-10 https://doi.org/10.1016/j.microrel.2015.06.079	journal	August 2015
Probing Single-Molecule Interfacial Electron Transfer Dynamics of Porphyrin on TiO ₂ Nanoparticles Wang, Yuanmin; Wang, Xuefei; Ghosh, Sujit Kumar Journal of the American Chemical Society, Vol. 131, Issue 4 https://doi.org/10.1021/ja806988d	journal	February 2009
Microwave-Assisted Fabrication of Carbon Nanotube AFM Tips Druzhinina, Tamara S.; Hoeppener, Stephanie; Schubert, Ulrich S. Nano Letters, Vol. 10, Issue 10 https://doi.org/10.1021/nl101934j	journal	October 2010
Single-Crystal Diamond Nanowire Tips for Ultrasensitive Force Microscopy Tao, Y.; Degen, C. L. Nano Letters, Vol. 15, Issue 12 https://doi.org/10.1021/acs.nanolett.5b02885	journal	November 2015
Enhanced Functionality of Nanotube Atomic Force Microscopy Tips by Polymer Coating Patil, Amol; Sippel, Jennifer; Martin, Gregory W. Nano Letters, Vol. 4, Issue 2 https://doi.org/10.1021/nl0350581	journal	February 2004
Recent advances in the surface forces apparatus (SFA) technique Israelachvili, J.; Min, Y.; Akbulut, M. Reports on Progress in Physics, Vol. 73, Issue 3 https://doi.org/10.1088/0034-4885/73/3/036601	journal	January 2010

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Environmental Molecular Sciences Laboratory
focused ion beam
force measurement
microlithography
tip fabrication

Fabrication of oriented crystals as force measurement tips via focused ion beam and microlithography methods

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