Critical behavior of quasi-two-dimensional semiconducting ferromagnet Cr2Ge2Te6

Liu, Yu; Petrovic, C.

doi:10.1103/PhysRevB.96.054406

Title: Critical behavior of quasi-two-dimensional semiconducting ferromagnet ${Cr}_{2} {Ge}_{2} {Te}_{6}$

Journal Article · Thu Aug 03 00:00:00 EDT 2017 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.96.054406· OSTI ID:1412649

Liu, Yu ^[1]; Petrovic, C. ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States). Condensed Matter Physics and Materials Science Dept.

Some critical properties of the single-crystalline semiconducting ferromagnet Cr ₂ Ge ₂ Te ₆ were investigated by bulk dc magnetization around the paramagnetic to ferromagnetic phase transition. Critical exponents β = 0.200 ± 0.003 with a critical temperature T _c = 62.65 ± 0.07 K and γ = 1.28 ± 0.03 with T _c = 62.75 ± 0.06 K are obtained by the Kouvel-Fisher method whereas δ = 7.96 ± 0.01 is obtained by a critical isotherm analysis at T _c = 62.7 K. These critical exponents obey the Widom scaling relation δ = 1 + γ / β , indicating self-consistency of the obtained values. Furthermore, with these critical exponents the isotherm M ( H ) curves below and above the critical temperatures collapse into two independent universal branches, obeying the single scaling equation m = f _± ( h ) , where m and h are renormalized magnetization and field, respectively. The determined exponents match well with those calculated from the results of the renormalization group approach for a two-dimensional Ising system coupled with a long-range interaction between spins decaying as J ( r ) ≈ r ^{- ( d + σ )} with σ = 1.52 .

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704

OSTI ID:: 1412649

Alternate ID(s):: OSTI ID: 1373954

Report Number(s):: BNL-114365-2017-JA; PRBMDO; R&D Project: PM016; KC0201050; TRN: US1800316

Journal Information:: Physical Review B, Vol. 96, Issue 5; ISSN 2469-9950

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 72 works

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