RedThreads: An Interface for Application-Level Fault Detection/Correction Through Adaptive Redundant Multithreading

Hukerikar, Saurabh; Teranishi, Keita; Diniz, Pedro C.; Lucas, Robert F.

doi:10.1007/s10766-017-0492-3

Title: RedThreads: An Interface for Application-Level Fault Detection/Correction Through Adaptive Redundant Multithreading

Journal Article · Sat Feb 11 00:00:00 EST 2017 · International Journal of Parallel Programming

DOI:https://doi.org/10.1007/s10766-017-0492-3· OSTI ID:1411881

^[1]; Teranishi, Keita ^[2]; Diniz, Pedro C. ^[1]; Lucas, Robert F. ^[1]

Univ. of Southern California, Marina del Rey, CA (United States)
Sandia National Lab. (SNL-CA), Livermore, CA (United States)

In the presence of accelerated fault rates, which are projected to be the norm on future exascale systems, it will become increasingly difficult for high-performance computing (HPC) applications to accomplish useful computation. Due to the fault-oblivious nature of current HPC programming paradigms and execution environments, HPC applications are insufficiently equipped to deal with errors. We believe that HPC applications should be enabled with capabilities to actively search for and correct errors in their computations. The redundant multithreading (RMT) approach offers lightweight replicated execution streams of program instructions within the context of a single application process. Furthermore, the use of complete redundancy incurs significant overhead to the application performance.

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Research Organization:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)

Grant/Contract Number:: AC04-94AL85000

OSTI ID:: 1411881

Report Number(s):: SAND-2017-1596J; PII: 492; TRN: US1800281

Journal Information:: International Journal of Parallel Programming, Vol. 46, Issue 2; ISSN 0885-7458

Publisher:: SpringerCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 11 works

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Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems Serrano-Cases, Alejandro; Restrepo-Calle, Felipe; Cuenca-Asensi, Sergio Journal of Electronic Testing, Vol. 36, Issue 1 https://doi.org/10.1007/s10836-019-05846-4	journal	December 2019

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