Correlative Magnetic Imaging of Heat-Assisted Magnetic Recording Media in Cross Section Using Lorentz TEM and MFM

Journal Article · Mon Oct 23 00:00:00 EDT 2017 · IEEE Transactions on Magnetics

DOI:https://doi.org/10.1109/TMAG.2017.2753170· OSTI ID:1405331

Kim, Taeho Roy  ^[1]; Phatak, Charudatta ^[2]; Petford-Long, Amanda K. ^[3]; Liu, Yunzhi ^[1]; Taylor, Chad ^[4]; Zhang, Bing ^[4]; Myers, Sharon ^[4]; Greene, Andrea ^[4]; Seki, Tomoko ^[4]; Alex, Michael ^[4]; Bertero, Gerardo A. ^[4]; Sinclair, Robert ^[1]

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1. Stanford Univ., Stanford, CA (United States)
2. Argonne National Lab. (ANL), Argonne, IL (United States)
3. Argonne National Lab. (ANL), Argonne, IL (United States); Northwestern Univ., Evanston, IL (United States)
4. Western Digital Corp., San Jose, CA (United States)

In order to increase the storage density of hard disk drives, a detailed understanding of the magnetic structure of the granular magnetic layer is essential. Here, we demonstrate an experimental procedure of imaging recorded bits on heat-assisted magnetic recording (HAMR) media in cross section using Lorentz transmission electron microscopy (TEM). With magnetic force microscopy and focused ion beam (FIB), we successfully targeted a single track to prepare cross-sectional TEM specimens. Then, we characterized the magnetic structure of bits with their precise location and orientation using Fresnel mode of Lorentz TEM. Here, this method can promote understanding of the correlation between bits and their material structure in HAMR media to design better the magnetic layer.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22), Materials Sciences and Engineering Division; National Science Foundation (NSF)
• Grant/Contract Number: AC02-06CH11357
• OSTI ID: 1405331
• Journal Information: IEEE Transactions on Magnetics, Vol. PP, Issue 99; ISSN 0018-9464
• Publisher: Institute of Electrical and Electronics Engineers. Magnetics Group
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
36 MATERIALS SCIENCE