X-Ray Characterization of Resistor/Dielectric Material for Low Temperature Co-Fired Ceramic Packages

Conference · Wed Sep 08 00:00:00 EDT 1999

OSTI ID:13995

DIMOS, DUANE B; KOTULA, PAUL G; RODRIGUEZ, MARK A; YANG, PIN

High temperature XRD has been employed to monitor the devitrification of Dupont 951 low temperature co-fired ceramic (LTCC) and Dupont E84005 resistor ink. The LTCC underwent devitrification to an anorthite phase in the range of 835-875 C with activation energy of 180 kJ/mol as calculated from kinetic data. The resistor paste underwent devitrification in the 835-875 C range forming monoclinic and hexagonal celcian phases plus a phase believed to be a zinc-silicate. RuO{sub 2} appeared to be stable within this devitrified resistor matrix. X-ray radiography of a co-fired circuit indicated good structural/chemical compatibility between the resistor and LTCC.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 13995
• Report Number(s): SAND99-2324C; TRN: AH200135%%532
• Resource Relation: Conference: Denver X-Ray Conference, Steamboat Springs, CO (US), 08/02/1999--08/06/1999; Other Information: PBD: 8 Sep 1999
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING
ACTIVATION ENERGY
CERAMICS
COMPATIBILITY
KINETICS
MONITORS
RESISTORS
X-RAY RADIOGRAPHY
DECOMPOSITION
PHASE TRANSFORMATIONS