Critical current oscillations of elliptical Josephson junctions with single-domain ferromagnetic layers
Journal Article
·
· Journal of Applied Physics
- Michigan State Univ., East Lansing, MI (United States). Department of Physics and Astronomy
- Northrop Grumman Systems Corporation, Baltimore, MD (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
We report that josephson junctions containing ferromagnetic layers are of considerable interest for the development of practical cryogenic memory and superconducting qubits. Such junctions exhibit a ground-state phase shift of π for certain ranges of ferromagnetic layer thicknesses. We present studies of Nb based micron-scale elliptically shaped Josephson junctions containing ferromagnetic barriers of Ni81Fe19 or Ni65Fe15Co20. By applying an external magnetic field, the critical current of the junctions is found to follow characteristic Fraunhofer patterns and display sharp switching behavior suggestive of single-domain magnets. The high quality of the Fraunhofer patterns enables us to extract the maximum value of the critical current even when the peak is shifted significantly outside the range of the data due to the magnetic moment of the ferromagnetic layer. The maximum value of the critical current oscillates as a function of the ferromagnetic barrier thickness, indicating transitions in the phase difference across the junction between values of zero and π. Lastly, we compare the data to previous work and to models of the 0-π transitions based on existing theories.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, null
- Sponsoring Organization:
- IARPA; USDOE; USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- AC04-94AL85000; NA0003525
- OSTI ID:
- 1411619
- Alternate ID(s):
- OSTI ID: 1398292
- Report Number(s):
- SAND--2017-12975J; 659178
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 13 Vol. 122; ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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