Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film

Lee, Hyeon Jun; Lee, Sung Su; Kwak, Jeong Hun; Kim, Young-Min; Jeong, Hu Young; Borisevich, Albina Y.; Lee, Su Yong; Noh, Do Young; Kwon, Owoong; Kim, Yunseok; Jo, Ji Young

doi:10.1038/srep38724

Title: Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film

Journal Article · Thu Dec 01 00:00:00 EST 2016 · Scientific Reports

DOI:https://doi.org/10.1038/srep38724· OSTI ID:1394556

Lee, Hyeon Jun; Lee, Sung Su; Kwak, Jeong Hun; Kim, Young-Min; Jeong, Hu Young; Borisevich, Albina Y.; Lee, Su Yong; Noh, Do Young; Kwon, Owoong; Kim, Yunseok; Jo, Ji Young

For epitaxial films, a critical thickness (t_c) can create a phenomenological interface between a strained bottom layer and a relaxed top layer. Here, we present an experimental report of how the tc in BiFeO₃ thin films acts as a boundary to determine the crystalline phase, ferroelectricity, and piezoelectricity in 60 nm thick BiFeO₃/SrRuO₃/SrTiO₃ substrate. We found larger Fe cation displacement of the relaxed layer than that of strained layer. In the time-resolved X-ray microdiffraction analyses, the piezoelectric response of the BiFeO₃ film was resolved into a strained layer with an extremely low piezoelectric coefficient of 2.4 pm/V and a relaxed layer with a piezoelectric coefficient of 32 pm/V. The difference in the Fe displacements between the strained and relaxed layers is in good agreement with the differences in the piezoelectric coefficient due to the electromechanical coupling.

Cite

Export

Save

Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC05-00OR22725

OSTI ID:: 1394556

Journal Information:: Scientific Reports, Vol. 6, Issue 1; ISSN 2045-2322

Publisher:: Nature Publishing Group

Country of Publication:: United States

Language:: English

References (28)

Thickness dependence of piezoelectric property of ultrathin BiFeO3 films Zhao, J. L.; Lu, H. X.; Sun, J. R. Physica B: Condensed Matter, Vol. 407, Issue 12 https://doi.org/10.1016/j.physb.2012.03.010	journal	June 2012
Giant elastic tunability in strained BiFeO3 near an electrically induced phase transition Li, Q.; Cao, Y.; Yu, P. Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms9985	journal	November 2015
Thickness-induced stabilization of ferroelectricity in SrRuO3/Ba0.5Sr0.5TiO3/Au thin film capacitors Sinnamon, L. J.; Bowman, R. M.; Gregg, J. M. Applied Physics Letters, Vol. 81, Issue 5 https://doi.org/10.1063/1.1496144	journal	July 2002
Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO[sub 3] films Kim, Dae Ho; Lee, Ho Nyung; Biegalski, Michael D. Applied Physics Letters, Vol. 92, Issue 1 https://doi.org/10.1063/1.2830799	journal	January 2008
Piezoelectricity in the Dielectric Component of Nanoscale Dielectric-Ferroelectric Superlattices Jo, Ji Young; Sichel, Rebecca J.; Lee, Ho Nyung Physical Review Letters, Vol. 104, Issue 20 https://doi.org/10.1103/PhysRevLett.104.207601	journal	May 2010
X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal Miceli, P. F.; Palmstro/m, C. J. Physical Review B, Vol. 51, Issue 8 https://doi.org/10.1103/PhysRevB.51.5506	journal	February 1995
Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. I. Theory Speck, J. S.; Pompe, W. Journal of Applied Physics, Vol. 76, Issue 1 https://doi.org/10.1063/1.357097	journal	July 1994
Polarization screening-induced magnetic phase gradients at complex oxide interfaces Spurgeon, Steven R.; Balachandran, Prasanna V.; Kepaptsoglou, Despoina M. Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms7735	journal	April 2015
Growth dynamics and strain relaxation mechanisms in ${BaTiO}_{3}$ pulsed laser deposited on ${SrRuO}_{3} ∕ {SrTiO}_{3}$ He, J. Q.; Vasco, E.; Dittmann, R. Physical Review B, Vol. 73, Issue 12 https://doi.org/10.1103/PhysRevB.73.125413	journal	March 2006
Leakage current and breakdown electric-field studies on ultrathin atomic-layer-deposited Al2O3 on GaAs Lin, H. C.; Ye, P. D.; Wilk, G. D. Applied Physics Letters, Vol. 87, Issue 18 https://doi.org/10.1063/1.2120904	journal	October 2005
Flexoelectric Effect in the Reversal of Self-Polarization and Associated Changes in the Electronic Functional Properties of BiFeO ₃ Thin Films Jeon, Byung Chul; Lee, Daesu; Lee, Myang Hwan Advanced Materials, Vol. 25, Issue 39 https://doi.org/10.1002/adma.201301601	journal	July 2013
Competing Misfit Relaxation Mechanisms in Epitaxial Correlated Oxides Sandiumenge, Felip; Santiso, José; Balcells, Lluís Physical Review Letters, Vol. 110, Issue 10 https://doi.org/10.1103/PhysRevLett.110.107206	journal	March 2013
Strain relaxation during in situ growth of SrTiO3 thin films Peng, Luke S. -J.; Xi, X. X.; Moeckly, Brian H. Applied Physics Letters, Vol. 83, Issue 22 https://doi.org/10.1063/1.1631055	journal	December 2003
Direct observation of ferroelectric field effect and vacancy-controlled screening at the BiFeO3/LaxSr1−xMnO3 interface Kim, Young-Min; Morozovska, Anna; Eliseev, Eugene Nature Materials, Vol. 13, Issue 11 https://doi.org/10.1038/nmat4058	journal	August 2014
Thickness dependence of polarization in ferroelectric perovskite thin films Liu, Gang; Nan, Ce-Wen Journal of Physics D: Applied Physics, Vol. 38, Issue 4 https://doi.org/10.1088/0022-3727/38/4/010	journal	February 2005
Whither the oxide interface Chakhalian, J.; Millis, A. J.; Rondinelli, J. Nature Materials, Vol. 11, Issue 2 https://doi.org/10.1038/nmat3225	journal	January 2012
Critical thickness of high structural quality SrTiO3 films grown on orthorhombic (101) DyScO3 Biegalski, M. D.; Fong, D. D.; Eastman, J. A. Journal of Applied Physics, Vol. 104, Issue 11 https://doi.org/10.1063/1.3037216	journal	December 2008
Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates Kim, D. M.; Eom, C. B.; Nagarajan, V. Applied Physics Letters, Vol. 88, Issue 14 https://doi.org/10.1063/1.2185614	journal	April 2006
Thickness effect on the dielectric, ferroelectric, and piezoelectric properties of ferroelectric lead zirconate titanate thin films Pérez de la Cruz, J.; Joanni, E.; Vilarinho, P. M. Journal of Applied Physics, Vol. 108, Issue 11 https://doi.org/10.1063/1.3514170	journal	December 2010
Topography engineering of ferroelectric crystalline copolymer film Lee, Hyeon Jun; Kim, Yong-Jae; Lee, Eunji Organic Electronics, Vol. 15, Issue 3 https://doi.org/10.1016/j.orgel.2014.01.005	journal	March 2014
Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr _0.52 ,Ti _0.48 )O ₃ thin films Nguyen, Minh D.; Dekkers, Matthijn; Houwman, Evert Applied Physics Letters, Vol. 99, Issue 25 https://doi.org/10.1063/1.3669527	journal	December 2011
Critical thickness for extrinsic contributions to the dielectric and piezoelectric response in lead zirconate titanate ultrathin films Bastani, Yaser; Schmitz-Kempen, Thorsten; Roelofs, Andreas Journal of Applied Physics, Vol. 109, Issue 1 https://doi.org/10.1063/1.3527970	journal	January 2011
Nanosecond Dynamics of Ferroelectric/Dielectric Superlattices Jo, Ji Young; Chen, Pice; Sichel, Rebecca J. Physical Review Letters, Vol. 107, Issue 5 https://doi.org/10.1103/PhysRevLett.107.055501	journal	July 2011
Enhancement of the anisotropic photocurrent in ferroelectric oxides by strain gradients Chu, Kanghyun; Jang, Byung-Kweon; Sung, Ji Ho Nature Nanotechnology, Vol. 10, Issue 11 https://doi.org/10.1038/nnano.2015.191	journal	August 2015
Critical thickness for ferroelectricity in perovskite ultrathin films Junquera, Javier; Ghosez, Philippe Nature, Vol. 422, Issue 6931, p. 506-509 https://doi.org/10.1038/nature01501	journal	April 2003
New Approach in Equilibrium Theory for Strained Layer Relaxation Fischer, A.; Kühne, H.; Richter, H. Physical Review Letters, Vol. 73, Issue 20 https://doi.org/10.1103/PhysRevLett.73.2712	journal	November 1994
Atomic mechanism of polarization-controlled surface reconstruction in ferroelectric thin films Gao, Peng; Liu, Heng-Jui; Huang, Yen-Lin Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms11318	journal	April 2016
Epitaxial BiFeO₃ Multiferroic Thin Film Heterostructures Wang, J.; Neaton, J. B.; Zheng, H. Science, Vol. 299, Issue 5613, p. 1719-1722 https://doi.org/10.1126/science.1080615	journal	March 2003

Similar Records

Nanoscale piezoresponse studies of ferroelectric domains in epitaxial BiFeO{sub 3} nanostructures

Journal Article · Sun Mar 15 00:00:00 EDT 2009 · Journal of Applied Physics · OSTI ID:1394556

Hong, Seungbum; Petford-Long, Amanda; Klug, Jeffrey A; +5 more

Nanoscale piezoresponse studies of ferroelectric domains in epitaxial BiFeO{sub 3} nanostructures.

Conference · Sun Mar 15 00:00:00 EDT 2009 · J. Appl. Phys. · OSTI ID:1394556

Hong, S; Klug, J A; Park, M; +5 more

Thickness and strain dependence of piezoelectric coefficient in

{BaTiO}_{3}

thin films

Journal Article · Wed Feb 12 00:00:00 EST 2020 · Physical Review Materials · OSTI ID:1394556

Kelley, K. P.; Yilmaz, D. E.; Collins, L.; +6 more

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
Ferroelectrics and multiferroics
Electronic properties and materials

Title: Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film

Citation Formats

References (28)

Similar Records

Related Subjects