Understanding individual defects in CdTe thin-film solar cells via STEM: From atomic structure to electrical activity

Li, Chen; Poplawsky, Jonathan; Yan, Yanfa; Pennycook, Stephen J.

doi:10.1016/j.mssp.2016.06.017

Title: Understanding individual defects in CdTe thin-film solar cells via STEM: From atomic structure to electrical activity

Journal Article · Sat Jul 01 00:00:00 EDT 2017 · Materials Science in Semiconductor Processing

DOI:https://doi.org/10.1016/j.mssp.2016.06.017· OSTI ID:1393810

Li, Chen ^[1];

^[2]; Yan, Yanfa ^[3]; Pennycook, Stephen J. ^[4]

Univ. of Vienna (Austria). Dept. of Lithospheric Research
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division
Univ. of Toledo, OH (United States). Dept. of Physics and Astronomy
National Univ. of Singapore (Singapore). Dept. of Materials Science and Engineering

Here in this paper we review a systematic study of the structure-property correlations of a series of defects in CdTe solar cells. A variety of experimental methods, including aberration-corrected scanning transmission electron microscopy, electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, and electron-beam-induced current have been combined with density-functional theory. The research traces the connections between the structures and electrical activities of individual defects including intra-grain partial dislocations, grain boundaries and the CdTe/CdS interface. The interpretations of the physical origin underlying the structure-property correlation provide insights that should further the development of future CdTe solar cells.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE)

Grant/Contract Number:: AC05-00OR22725; FOA-0000492

OSTI ID:: 1393810

Alternate ID(s):: OSTI ID: 1496415

Journal Information:: Materials Science in Semiconductor Processing, Vol. 65, Issue C; ISSN 1369-8001

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 31 works

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36 MATERIALS SCIENCE
14 SOLAR ENERGY
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scanning transmission electron microscopy
dislocation
grain boundary
interface

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