Dielectric collapse at the LaAlO3/SrTiO3 (001) heterointerface under applied electric field
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Stanford Univ., CA (United States). Geballe Lab. for Advanced Materials
- SLAC National Accelerator Lab., Menlo Park, CA (United States); Univ. of Tokyo (Japan)
- High Energy Accelerator Research Organization (KEK), Tsukuba (Japan)
- Univ. of Tokyo (Japan)
- Japan Synchrotron Radiation Research Inst. (JASRI), Sayo (Japan)
- SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., CA (United States). Geballe Lab. for Advanced Materials
The fascinating interfacial transport properties at the LaAlO3/SrTiO3 heterointerface have led to intense investigations of this oxide system. Exploiting the large dielectric constant of SrTiO3 at low temperatures, tunability in the interfacial conductivity over a wide range has been demonstrated using a back-gate device geometry. In order to understand the effect of back-gating, it is crucial to assess the interface band structure and its evolution with external bias. In this study, we report measurements of the gate-bias dependent interface band alignment, especially the confining potential profile, at the conducting LaAlO3/SrTiO3 (001) heterointerface using soft and hard x-ray photoemission spectroscopy in conjunction with detailed model simulations. Depth-profiling analysis incorporating the electric field dependent dielectric constant in SrTiO3 reveals that a significant potential drop on the SrTiO3 side of the interface occurs within ~2 nm of the interface under negative gate-bias. These results demonstrate gate control of the collapse of the dielectric permittivity at the interface, and explain the dramatic loss of electron mobility with back-gate depletion.
- Research Organization:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC02-76SF00515
- OSTI ID:
- 1390591
- Journal Information:
- Scientific Reports, Vol. 7, Issue 1; ISSN 2045-2322
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Charge-transfer in B-site-depleted NdGaO 3 /SrTiO 3 heterostructures
|
journal | July 2018 |
Charge-transfer in B-site-depleted NdGaO3/SrTiO3 heterostructures
|
text | January 2018 |
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