Measurement of the branching fraction and CP asymmetry in B0→π0π0 decays, and an improved constraint on Φ2

Julius, T.; Sevior, M. E.; Mohanty, G. B.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Aulchenko, V.; Aushev, T.; Ayad, R.; Babu, V.; Badhrees, I.; Bakich, A. M.; Bansal, V.; Barberio, E.; Barrett, M.; Berger, M.; Bhardwaj, V.; Bhuyan, B.; Biswal, J.; Bloomfield, T.; Bobrov, A.; Bondar, A.; Bonvicini, G.; Bozek, A.; Bračko, M.; Browder, T. E.; Červenkov, D.; Chang, M. -C.; Chao, Y.; Chekelian, V.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, K.; Choi, Y.; Cinabro, D.; Dash, N.; Di Carlo, S.; Doležal, Z.; Dossett, D.; Drásal, Z.; Dutta, D.; Eidelman, S.; Farhat, H.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Gillard, R.; Goldenzweig, P.; Haba, J.; Hara, T.; Hayasaka, K.; Hayashii, H.; Hou, W. -S.; Hsu, C. -L.; Iijima, T.; Inami, K.; Ishikawa, A.; Itoh, R.; Iwasaki, Y.; Jacobs, W. W.; Jaegle, I.; Jin, Y.; Joffe, D.; Joo, K. K.; Kahn, J.; Karyan, G.; Katrenko, P.; Kawasaki, T.; Kiesling, C.; Kim, D. Y.; Kim, H. J.; Kim, J. B.; Kim, K. T.; Kim, M. J.; Kim, S. H.; Kim, Y. J.; Kinoshita, K.; Kodyš, P.; Korpar, S.; Kotchetkov, D.; Križan, P.; Krokovny, P.; Krohn, J. F.; Kuhr, T.; Kulasiri, R.; Kuzmin, A.; Kwon, Y. -J.; Lange, J. S.; Lee, I. S.; Li, C. H.; Li, L.; Li, Y.; Li Gioi, L.; Libby, J.; Liventsev, D.; Luo, T.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Moon, H. K.; Mori, T.; Mussa, R.; Nakano, E.; Nakao, M.; Nanut, T.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Nisar, N. K.; Nishida, S.; Ogawa, S.; Ono, H.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Park, C. -S.; Park, H.; Pesántez, L.; Pestotnik, R.; Piilonen, L. E.; Pulvermacher, C.; Ritter, M.; Sahoo, H.; Sakai, Y.; Salehi, M.; Sandilya, S.; Santelj, L.; Sanuki, T.; Sato, Y.; Savinov, V.; Schneider, O.; Schnell, G.; Schwanda, C.; Schwartz, A. J.; Seino, Y.; Senyo, K.; Shebalin, V.; Shibata, T. -A.; Shiu, J. -G.; Shwartz, B.; Sokolov, A.; Solovieva, E.; Starič, M.; Sumiyoshi, T.; Tamponi, U.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uehara, S.; Uglov, T.; Unno, Y.; Uno, S.; Urquijo, P.; Usov, Y.; Van Hulse, C.; Varner, G.; Varvell, K. E.; Vossen, A.; Waheed, E.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Watanabe, M.; Watanabe, Y.; Widmann, E.; Williams, K. M.; Won, E.; Yamashita, Y.; Ye, H.; Yuan, C. Z.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhulanov, V.; Zupanc, A.

doi:10.1103/PhysRevD.96.032007

Title: Measurement of the branching fraction and $C P$ asymmetry in $B^{0} \to π^{0} π^{0}$ decays, and an improved constraint on $Φ_{2}$

Journal Article · Tue Aug 01 00:00:00 EDT 2017 · Physical Review D

DOI:https://doi.org/10.1103/PhysRevD.96.032007· OSTI ID:1390427

Julius, T.; Sevior, M. E.; Mohanty, G. B.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Aulchenko, V.; Aushev, T.; Ayad, R.; Babu, V.; Badhrees, I.; Bakich, A. M.; Bansal, V.; Barberio, E.; Barrett, M.; Berger, M.; Bhardwaj, V.; Bhuyan, B.; Biswal, J. more »

We measure the branching fraction and CP violation asymmetry in the decay B0 ! 00, using a data sample of 752 106 BB pairs collected at the (4S) resonance with the Belle detector at the KEKB e+e collider. The obtained branching fraction and direct CP asymmetry are B(B !00) = [1:31 0:19 (stat.) 0:19 (syst.)] 106 and ACP = +0:14 0:36 (stat.) :10 (syst.); respectively. The signal signicance, including the systematic uncertainty, is 6.4 standard deviations. We combine these results with Belle's earlier measurements of B0 ! + and B ! 0 to exclude the CP-violating parameter 2 from the range 15:5 < 2 < 75:0 at 95% condence level.

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Research Organization:: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)

Sponsoring Organization:: USDOE

Contributing Organization:: Belle Collaboration

DOE Contract Number:: AC05-76RL01830

OSTI ID:: 1390427

Report Number(s):: PNNL-SA-128818; PRVDAQ; KA2201020

Journal Information:: Physical Review D, Vol. 96, Issue 3; ISSN 2470-0010

Publisher:: American Physical Society (APS)

Country of Publication:: United States

Language:: English

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