Single-Grating Talbot Imaging for Wavefront Sensing and X-Ray Metrology

Conference · Sun Jan 01 00:00:00 EST 2017

DOI:https://doi.org/10.1117/12.2274023· OSTI ID:1390273

Grizolli, Walan; Shi, Xianbo; Kolodziej, Tomasz; Shvyd'ko, Yuri; Assoufid, Lahsen

Single-grating Talbot imaging relies on high-spatial-resolution detectors to perform accurate measurements of X-ray beam wavefronts. The wavefront can be retrieved with a single image, and a typical measurement and data analysis can be performed in few seconds. These qualities make it an ideal tool for synchrotron beamline diagnostics and in-situ metrology. The wavefront measurement can be used both to obtain a phase contrast image of an object and to characterize an X-ray beam. In this work, we explore the concept in two cases: at-wavelength metrology of 2D parabolic beryllium lenses and a wavefront sensor using a diamond crystal beam splitter.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: Argonne National Laboratory; USDOE Office of Science (SC), Basic Energy Sciences (BES)
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1390273
• Resource Relation: Conference: 2017 SPIE Optics + Photonics Conference, 08/06/17 - 08/10/17, San Diego, CA, US
• Country of Publication: United States
• Language: English

Related Subjects

Grating Interferometry
Phase Contrast Image
Talbot Image
Wavefront Sensing