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Title: Vertical Bridgman growth and characterization of Cd 0.95-xMn xZn 0.05Te (x=0.20, 0.30) single-crystal ingots

Abstract

Solid-liquid phase transitions in Cd 0.95-xMn xZn 0.05Te alloys with x = 0.20 and 0.30 were investigated by differential thermal analysis (DTA). The heating/cooling rates were 5 and 10 K/min with a melt dwell time of 10, 30 and 60 minutes. Cd 0.95-xMn xZn 0.05Te (x=0.20, 0.30) single-crystal ingots were grown by the vertical Bridgman method guided using the DTA results. Te inclusions (1-20 microns), typical for CdTe and Cd(Zn)Te crystals, were observed in the ingots by infrared transmission microscopy. The measured X-ray diffraction patterns showed that all compositions are found to be in a single phase. Using current-voltage (I-V) measurements, the resistivity of the samples from each ingot was estimated to be about 10 5 Ohm·cm. The optical transmission analysis demonstrated that the band-gap width of the investigated ingots increased from 1.77 to 1.88 eV with the increase of the MnTe content from 20 to 30 mol. %.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation (NA-20)
OSTI Identifier:
1389224
Report Number(s):
BNL-114131-2017
TRN: US1801145
DOE Contract Number:
SC0012704
Resource Type:
Technical Report
Resource Relation:
Related Information: SPIE Optics + Photonics 2017; San Diego Convention Center; 20170806 through 20170810
Country of Publication:
United States
Language:
English
Subject:
98 NUCLEAR DISARMAMENT, SAFEGUARDS, AND PHYSICAL PROTECTION; MONOCRYSTALS; X-RAY DIFFRACTION; X RADIATION; BRIDGMAN METHOD; differential thermal analysis (DTA); Cd0.95-xMnxZn0.05; Bridgman technique; semimagnetic semiconductor; clusters volume fraction; XRD

Citation Formats

Bolotnikov, A., Kopach, V., Kopach, O., Shcherbak, L., Fochuk, P., Filonenko, S., and James, R.. Vertical Bridgman growth and characterization of Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots. United States: N. p., 2017. Web. doi:10.2172/1389224.
Bolotnikov, A., Kopach, V., Kopach, O., Shcherbak, L., Fochuk, P., Filonenko, S., & James, R.. Vertical Bridgman growth and characterization of Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots. United States. doi:10.2172/1389224.
Bolotnikov, A., Kopach, V., Kopach, O., Shcherbak, L., Fochuk, P., Filonenko, S., and James, R.. Tue . "Vertical Bridgman growth and characterization of Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots". United States. doi:10.2172/1389224. https://www.osti.gov/servlets/purl/1389224.
@article{osti_1389224,
title = {Vertical Bridgman growth and characterization of Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots},
author = {Bolotnikov, A. and Kopach, V. and Kopach, O. and Shcherbak, L. and Fochuk, P. and Filonenko, S. and James, R.},
abstractNote = {Solid-liquid phase transitions in Cd0.95-xMnxZn0.05Te alloys with x = 0.20 and 0.30 were investigated by differential thermal analysis (DTA). The heating/cooling rates were 5 and 10 K/min with a melt dwell time of 10, 30 and 60 minutes. Cd0.95-xMnxZn0.05Te (x=0.20, 0.30) single-crystal ingots were grown by the vertical Bridgman method guided using the DTA results. Te inclusions (1-20 microns), typical for CdTe and Cd(Zn)Te crystals, were observed in the ingots by infrared transmission microscopy. The measured X-ray diffraction patterns showed that all compositions are found to be in a single phase. Using current-voltage (I-V) measurements, the resistivity of the samples from each ingot was estimated to be about 105 Ohm·cm. The optical transmission analysis demonstrated that the band-gap width of the investigated ingots increased from 1.77 to 1.88 eV with the increase of the MnTe content from 20 to 30 mol. %.},
doi = {10.2172/1389224},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 01 00:00:00 EDT 2017},
month = {Tue Aug 01 00:00:00 EDT 2017}
}

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