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Title: Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths

Journal Article · · Physical Review Letters
 [1];  [1];  [2];  [1];  [1];  [1];  [1]
  1. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  2. Boston Univ., Boston, MA (United States)

Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Furthermore by using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations.

Research Organization:
Energy Frontier Research Centers (EFRC) (United States). Solid-State Solar-Thermal Energy Conversion Center (S3TEC); Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0001299; FG02-09ER46577
OSTI ID:
1386868
Alternate ID(s):
OSTI ID: 1100641
Journal Information:
Physical Review Letters, Vol. 107, Issue 9; Related Information: S3TEC partners with Massachusetts Institute of Technology (lead); Boston College; Oak Ridge National Laboratory; Rensselaer Polytechnic Institute; ISSN 0031-9007
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 397 works
Citation information provided by
Web of Science

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Figures / Tables (3)