Focused ion beam preparation of samples for X-ray nanotomography

Lombardo, Jeffrey J.; Ristau, Roger A.; Harris, William M.; Chiu, Wilson K.  S.

doi:10.1107/S0909049512027252

Focused ion beam preparation of samples for X-ray nanotomography

Journal Article · Thu Jul 12 04:00:00 EDT 2012 · Journal of Synchrotron Radiation

DOI:https://doi.org/10.1107/S0909049512027252· OSTI ID:1381914

Lombardo, Jeffrey J.; Ristau, Roger A.; Harris, William M.; Chiu, Wilson K. S.

Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Heterogeneous Functional Materials Center (HeteroFoaM)

Sponsoring Organization:: USDOE SC Office of Basic Energy Sciences (SC-22)

DOE Contract Number:: SC0001061

OSTI ID:: 1381914

Journal Information:: Journal of Synchrotron Radiation, Journal Name: Journal of Synchrotron Radiation Journal Issue: 5 Vol. 19; ISSN 0909-0495; ISSN JSYRES

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

References (17)

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Characterization and analysis methods for the examination of the heterogeneous solid oxide fuel cell electrode microstructure. Part 1: Volumetric measurements of the heterogeneous structure Grew, Kyle N.; Peracchio, Aldo A.; Joshi, Abhijit S. Journal of Power Sources, Vol. 195, Issue 24 https://doi.org/10.1016/j.jpowsour.2010.07.005	journal	December 2010
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Focused ion beam preparation of samples for X-ray nanotomography

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