Molecular orientation in soft matter thin films studied by resonant soft x-ray reflectivity

Mezger, Markus; Jérôme, Blandine; Kortright, Jeffrey B.; Valvidares, Manuel; Gullikson, Eric M.; Giglia, Angelo; Mahne, Nicola; Nannarone, Stefano

doi:10.1103/PhysRevB.83.155406

Title: Molecular orientation in soft matter thin films studied by resonant soft x-ray reflectivity

Journal Article · Fri Apr 01 00:00:00 EDT 2011 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.83.155406· OSTI ID:1380455

Mezger, Markus; Jérôme, Blandine; Kortright, Jeffrey B.; Valvidares, Manuel; Gullikson, Eric M.; Giglia, Angelo; Mahne, Nicola; Nannarone, Stefano

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Gas Separations Relevant to Clean Energy Technologies (CGS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

DOE Contract Number:: SC0001015

OSTI ID:: 1380455

Journal Information:: Physical Review. B, Condensed Matter and Materials Physics, Vol. 83, Issue 15; Related Information: CGS partners with University of California, Berkeley; University of California, Davis; Lawrence Berkeley National Laboratory; University of Minnesota; National Energy Technology Laboratory; Texas A&M University; ISSN 1098-0121

Publisher:: American Physical Society (APS)

Country of Publication:: United States

Language:: English

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