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Title: High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction


The x-ray diffraction technique has been used to characterize crystalline phases in mixtures ever since its discovery.

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Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Org.:
OSTI Identifier:
Resource Type:
Journal Article
Resource Relation:
Journal Name: Microscopy and Microanalysis; Journal Volume: 22; Journal Issue: S3
Country of Publication:
United States

Citation Formats

Her, Jae-Hyuk, Gao, Yan, Jezek, Erik, Rijssenbeek, Job, Zhong,, and Parise,. High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction. United States: N. p., 2016. Web. doi:10.1017/S1431927616001288.
Her, Jae-Hyuk, Gao, Yan, Jezek, Erik, Rijssenbeek, Job, Zhong,, & Parise,. High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction. United States. doi:10.1017/S1431927616001288.
Her, Jae-Hyuk, Gao, Yan, Jezek, Erik, Rijssenbeek, Job, Zhong,, and Parise,. 2016. "High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction". United States. doi:10.1017/S1431927616001288.
title = {High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction},
author = {Her, Jae-Hyuk and Gao, Yan and Jezek, Erik and Rijssenbeek, Job and Zhong, and Parise,},
abstractNote = {The x-ray diffraction technique has been used to characterize crystalline phases in mixtures ever since its discovery.},
doi = {10.1017/S1431927616001288},
journal = {Microscopy and Microanalysis},
number = S3,
volume = 22,
place = {United States},
year = 2016,
month = 7
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