High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction
Journal Article
·
· Microscopy and Microanalysis
The x-ray diffraction technique has been used to characterize crystalline phases in mixtures ever since its discovery.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- DOE - BASIC ENERGY SCIENCES
- OSTI ID:
- 1377904
- Journal Information:
- Microscopy and Microanalysis, Vol. 22, Issue S3; ISSN 1431-9276
- Publisher:
- Microscopy Society of America (MSA)
- Country of Publication:
- United States
- Language:
- ENGLISH
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