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Title: High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction

Journal Article · · Microscopy and Microanalysis

The x-ray diffraction technique has been used to characterize crystalline phases in mixtures ever since its discovery.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
DOE - BASIC ENERGY SCIENCES
OSTI ID:
1377904
Journal Information:
Microscopy and Microanalysis, Vol. 22, Issue S3; ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
ENGLISH