X-ray study of the charge-density-wave transition in single-layer
Journal Article
·
· Physical Review B
Synchrotron x-ray studies of single-layer TiSe2 reveal displacements of the Ti and Se atoms as a function of temperature. The measurements, with a high sensitivity of 0.001 Å, show a (2x2) charge density wave (CDW) structure at temperatures below a critical temperature of TC1 = 233 K. The temperature dependence follows a BCS-like second-order mean-field behavior. A fivelayer TiSe2 film also exhibits a CDW transition of the same character but at a lower transition temperature of TC5 = 204 K, which is the same as that for bulk TiSe2. The results demonstrate that lattice distortion is an integral part of the CDW transition that must also involve renormalization of the electronic structure.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1377888
- Journal Information:
- Physical Review B, Vol. 95, Issue 20; ISSN 2469-9950
- Publisher:
- American Physical Society (APS)
- Country of Publication:
- United States
- Language:
- English
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