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Title: Avalanche diode having reduced dark current and method for its manufacture

Patent ·
OSTI ID:1377852

An avalanche diode includes an absorption region in a germanium body epitaxially grown on a silicon body including a multiplication region. Aspect-ratio trapping is used to suppress dislocation growth in the vicinity of the absorption region.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
National Technology & Engineering Solutions of Sandia, LLC
Patent Number(s):
9,748,429
Application Number:
14/870,195
OSTI ID:
1377852
Resource Relation:
Patent File Date: 2015 Sep 30
Country of Publication:
United States
Language:
English

References (11)

Thin-film spectroscopic sensor patent January 1992
Methods of fabricating semiconductor structures having epitaxially grown source and drain elements patent September 2005
Germanium silicon heterostructure photodetectors patent July 2008
Image sensor comprising isolated germanium photodetectors integrated with a silicon substrate and silicon circuitry patent November 2008
Defect reduction using aspect ratio trapping patent May 2012
Planar avalanche photodiode patent-application December 2004
Laterally-integrated waveguide photodetector apparatus and related coupling methods patent-application May 2007
Double quench circuit for an avalanche current device patent-application September 2008
Monolithic Three Terminal Photodetector patent-application May 2012
Study of the defect elimination mechanisms in aspect ratio trapping Ge growth journal March 2007
Defect reduction of selective Ge epitaxy in trenches on Si(001) substrates using aspect ratio trapping journal January 2007

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