Avalanche diode having reduced dark current and method for its manufacture
Patent
·
OSTI ID:1377852
An avalanche diode includes an absorption region in a germanium body epitaxially grown on a silicon body including a multiplication region. Aspect-ratio trapping is used to suppress dislocation growth in the vicinity of the absorption region.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC
- Patent Number(s):
- 9,748,429
- Application Number:
- 14/870,195
- OSTI ID:
- 1377852
- Resource Relation:
- Patent File Date: 2015 Sep 30
- Country of Publication:
- United States
- Language:
- English
Similar Records
Effect of low-temperature-grown GaN cap layer on reduced leakage current of GaN Schottky diodes
High performance waveguide-coupled Ge-on-Si linear mode avalanche photodiodes
AlGaAs/GaAs avalanche detector array -- 1 Gbit/s x-ray receiver for timing measurements
Journal Article
·
Mon Jan 31 00:00:00 EST 2005
· Applied Physics Letters
·
OSTI ID:1377852
High performance waveguide-coupled Ge-on-Si linear mode avalanche photodiodes
Journal Article
·
Tue Aug 09 00:00:00 EDT 2016
· Optics Express
·
OSTI ID:1377852
+5 more
AlGaAs/GaAs avalanche detector array -- 1 Gbit/s x-ray receiver for timing measurements
Journal Article
·
Sat Jun 01 00:00:00 EDT 1996
· IEEE Transactions on Nuclear Science
·
OSTI ID:1377852
+2 more