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Title: Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter

Journal Article · · Chinese Physics C, High Energy Physics and Nuclear Physics
 [1];  [2];  [2];  [2];  [2];  [2];  [3]
  1. Univ. of Science and Technology of China, Hefei (China). State Key Lab. of Particle Detection and Electronics; Univ. of Science and Technology of China, Hefei (China). Dept. of Modern Physics; Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Univ. of Science and Technology of China, Hefei (China). State Key Lab. of Particle Detection and Electronics; Univ. of Science and Technology of China, Hefei (China). Dept. of Modern Physics

ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown (LS2) in 2018, and a new LAr Trigger Digitizer Board (LTDB) will be designed and installed. Several commercial-off-the-shelf (COTS) multi-channel high-speed ADCs have been selected as possible backups of the radiation tolerant ADC ASICs for the LTDB. Here, to evaluate the radiation tolerance of these backup commercial ADCs, we developed an ADC radiation tolerance characterization system, which includes the ADC boards, data acquisition (DAQ) board, signal generator, external power supplies and a host computer. The ADC board is custom designed for different ADCs, with ADC drivers and clock distribution circuits integrated on board. The Xilinx ZC706 FPGA development board is used as a DAQ board. The data from the ADC are routed to the FPGA through the FMC (FPGA Mezzanine Card) connector, de-serialized and monitored by the FPGA, and then transmitted to the host computer through the Gigabit Ethernet. A software program has been developed with Python, and all the commands are sent to the DAQ board through Gigabit Ethernet by this program. Two ADC boards have been designed for the ADC, ADS52J90 from Texas Instruments and AD9249 from Analog Devices respectively. TID tests for both ADCs have been performed at BNL, and an SEE test for the ADS52J90 has been performed at Massachusetts General Hospital (MGH). Test results have been analyzed and presented. The test results demonstrate that this test system is very versatile, and works well for the radiation tolerance characterization of commercial multi-channel high-speed ADCs for the upgrade of the ATLAS LAr calorimeter. It is applicable to other collider physics experiments where radiation tolerance is required as well.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
Grant/Contract Number:
SC0012704
OSTI ID:
1376188
Report Number(s):
BNL-114175-2017-JA
Journal Information:
Chinese Physics C, High Energy Physics and Nuclear Physics, Vol. 41, Issue 2; ISSN 1674-1137
Publisher:
IOP PublishingCopyright Statement
Country of Publication:
United States
Language:
English

References (2)

Destructive single-event effects in semiconductor devices and ICs journal June 2003
Evaluation of commercial ADC radiation tolerance for accelerator experiments journal August 2015