Thermal conductivity of self-ion irradiated nanocrystalline zirconium thin films

Pulavarthy, Raghu; Wang, Baoming; Hattar, Khalid; Haque, M. A.

doi:10.1016/j.tsf.2017.07.035

Thermal conductivity of self-ion irradiated nanocrystalline zirconium thin films

Journal Article · Sat Jul 15 00:00:00 EDT 2017 · Thin Solid Films

DOI:https://doi.org/10.1016/j.tsf.2017.07.035· OSTI ID:1375322

Pulavarthy, Raghu ^[1]; Wang, Baoming ^[1]; Hattar, Khalid ^[2]; ^[1]

Pennsylvania State Univ., University Park, PA (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Thermomechanical stability and high thermal conductivity are important for nuclear cladding material performance and reliability, which degrade over time under irradiation. The literature suggests nanocrystalline materials as radiation tolerant, but little or no evidence is present from thermal transport perspective. In this study, we irradiated 10 nm grain size zirconium thin films with 800 keV Zr⁺ beam from a 6 MV HVE Tandem accelerator to achieve various doses of 3 × 10¹⁰ to 3.26 × 10¹⁴ ions/cm², corresponding to displacement per atom (dpa) of 2.1 × 10^–4 to 2.28. Transmission electron microscopy showed significant grain growth, texture evolution and oxidation in addition to the creation of displacement defects due to the irradiation. The specimens were co-fabricated with micro-heaters to establish thermal gradients that were mapped using infrared thermometry. An energy balance approach was used to estimate the thermal conductivity of the specimens, as function of irradiation dosage. As a result, up to 32% reduction of thermal conductivity was measured for the sample exposed to a dose of 2.1 dpa (3 × 10¹⁴ ions/cm²).

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); null

Sponsoring Organization:: USDOE; USDOE Office of Nuclear Energy (NE)

Grant/Contract Number:: AC04-94AL85000; NE0008259

OSTI ID:: 1375322

Alternate ID(s):: OSTI ID: 1549586
OSTI ID: 22729762

Report Number(s):: SAND--2017-8586J; PII: S0040609017305291

Journal Information:: Thin Solid Films, Journal Name: Thin Solid Films Journal Issue: C Vol. 638; ISSN 0040-6090

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
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