Factors Influencing the Stability of Au-Incorporated Metal-Oxide Supported Thin Films for Optical Gas Sensing

Baltrus, John P.; Holcomb, Gordon R.; Tylczak, Joseph H.; Ohodnicki, Paul R.

doi:10.1149/2.1451704jes

Title: Factors Influencing the Stability of Au-Incorporated Metal-Oxide Supported Thin Films for Optical Gas Sensing

Journal Article · Fri Feb 24 00:00:00 EST 2017 · Journal of the Electrochemical Society

DOI:https://doi.org/10.1149/2.1451704jes· OSTI ID:1374181

Baltrus, John P. ^[1]; Holcomb, Gordon R. ^[2]; Tylczak, Joseph H. ^[2]; Ohodnicki, Paul R. ^[1]

National Energy Technology Lab. (NETL), Pittsburgh, PA, (United States)
National Energy Technology Lab. (NETL), Albany, OR (United States)

There is interest in using Au-nanoparticle incorporated oxide films as functional sensor layers for high-temperature applications in optical-based sensors for measurements in both highly-oxidizing and highly-reducing atmospheres at temperatures approaching 900°C-1000°C because of a relatively high melting temperature combined with the inert nature of Au nanoparticles. This study includes a systematic series of experiments and theoretical calculations targeted at further understanding stability of Au-nanoparticle incorporated TiO₂ films as archetype sensing materials. A combination of thermodynamic modeling and long-term exposure tests were utilized to unambiguously determine that gas stream composition-dependent reactive evaporation of Au (to form predominately Au(g) or AuH(g), depending upon the environment) at the surface of the nanoparticles is the dominant mechanism for mass loss of Au. Primary factors dictating the rate of reactive evaporation, and hence the associated film stability, were determined to be the gas stream temperature and the concentration of H₂, with the former playing a more significant role over the ranges of temperatures (700°C - 800°C) and H₂ concentrations (1% to 29% H₂ by volume) explored. The mitigation of Au-mass loss through reactive evaporation was also successfully demonstrated by depositing a SiO₂ overlayer on the Au-nanoparticle embedded films to prevent direct Au-nanoparticle/vapor-phase contact.

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Research Organization:: National Energy Technology Laboratory, Pittsburgh, PA (United States). In-house Research; Albany Research Center (ARC), Albany, OR (United States)

Sponsoring Organization:: USDOE Office of Fossil Energy (FE)

OSTI ID:: 1374181

Report Number(s):: NETL-PUB-20904

Journal Information:: Journal of the Electrochemical Society, Vol. 164, Issue 4; Conference: Meeting of the Society, Honolulu, HI (United States), 2-7 Oct 2016; ISSN 0013-4651

Publisher:: The Electrochemical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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