Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Gong, Zhiliang; Kerr, Daniel; Hwang, Hyeondo Luke; Henderson, J. Michael; Suwatthee, Tiffany; Slaw, Benjamin R.; Cao, Kathleen D.; Lin, Binhua; Bu, Wei; Lee, Ka Yee C.

doi:10.1063/1.4978654

Title: Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Journal Article · Tue Mar 28 00:00:00 EDT 2017 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4978654· OSTI ID:1377924

Gong, Zhiliang ^[1]; Kerr, Daniel ^[1]; Hwang, Hyeondo Luke ^[1]; Henderson, J. Michael ^[1]; Suwatthee, Tiffany ^[1];

^[1]; Cao, Kathleen D. ^[1]; Lin, Binhua ^[1];

^[1]; Lee, Ka Yee C. ^[1]

Univ. of Chicago, IL (United States)

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package with a graphical user interface, named XeRay, for quick, accurate, and intuitive data analysis. XeRay lets the user model any layered system, each layer with its independent chemical composition and thickness, and enables fine-tuned data fitting. The accuracy of XeRay has been tested in the analysis of TXRF data from both air/liquid interface and liquid/liquid interfacial studies and has been compared to literature results. In an air/liquid interface study, Ca²⁺ sequestration was measured at a Langmuir monolayer of 1-stearoyl-2-oleoyl-sn-glycero-3-phosphatidic acid (SOPA) on a buffer solution of 1 mM CaCl2 at pH 7.5. Data analysis with XeRay reveals that each 1 nm2 of interfacial area contains 2.38 ± 0.06 Ca²⁺ ions, which corresponds to a 1:1 ratio between SOPA headgroups and Ca²⁺ ions, consistent with several earlier reports. For the liquid/liquid interface study of Sr²⁺ enrichment at the dodecane/surfactant/water interface, analysis using XeRay gives a surface enrichment of Sr²⁺ at $$68^{+6}_{-5}$$ Å² per ion, consistent with the result published for the same dataset.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: USDOE; National Science Foundation (NSF)

Grant/Contract Number:: AC02-06CH11357; NSF/CHE-1346572

OSTI ID:: 1377924

Alternate ID(s):: OSTI ID: 1373959

Journal Information:: Review of Scientific Instruments, Vol. 88, Issue 3; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: ENGLISH

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