Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers
- Univ. of Colorado, Boulder, CO (United States). Materials Science and Engineering Program
- Univ. of Colorado, Boulder, CO (United States). Dept. of Mechanical Engineering
- Columbia Univ., New York, NY (United States). Dept. of Mechanical Engineering; Univ. of Illinois at Urbana-Champaign, IL (United States). Dept. of Mechanical Science and Engineering
- Univ. of California, Berkeley, CA (United States). National Science Foundation (NSF) Nanoscale Science and Engineering Center
- Univ. of Illinois at Urbana-Champaign, IL (United States). Dept. of Mechanical Science and Engineering
- Columbia Univ., New York, NY (United States). Dept. of Mechanical Engineering
- Univ. of California, Berkeley, CA (United States). National Science Foundation (NSF) Nanoscale Science and Engineering Center; King Abdulaziz Univ., Jeddah (Saudi Arabia). Dept. of Physics; Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Materials Sciences Division
- Univ. of Colorado, Boulder, CO (United States). Materials Science and Engineering Program, and Dept. of Mechanical Engineering
Two-dimensional (2D) atomic materials such as graphene and transition metal dichalcogenides (TMDCs) have attracted significant research and industrial interest for their electronic, optical, mechanical, and thermal properties. While large-area crystal growth techniques such as chemical vapor deposition have been demonstrated, the presence of grain boundaries and orientation of grains arising in such growths substantially affect the physical properties of the materials. There is currently no scalable characterization method for determining these boundaries and orientations over a large sample area. We here present a second-harmonic generation based microscopy technique for rapidly mapping grain orientations and boundaries of 2D TMDCs. We experimentally demonstrate the capability to map large samples to an angular resolution of ±1° with minimal sample preparation and without involved analysis. A direct comparison of the all-optical grain orientation maps against results obtained by diffraction-filtered dark-field transmission electron microscopy plus selected-area electron diffraction on identical TMDC samples is provided. This rapid and accurate tool should enable large-area characterization of TMDC samples for expedited studies of grain boundary effects and the efficient characterization of industrial-scale production techniques.
- Research Organization:
- Energy Frontier Research Centers (EFRC) (United States). Light-Material Interactions in Energy Conversion (LMI)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0001293
- OSTI ID:
- 1371063
- Journal Information:
- Applied Physics Letters, Vol. 107, Issue 11; Related Information: LMI partners with California Institute of Technology (lead); Harvard University; University of Illinois, Urbana-Champaign; Lawrence Berkeley National Laboratory; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
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