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Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy

Journal Article · · ACS Applied Materials and Interfaces
 [1];  [1];  [1];  [2]
  1. Univ. of Texas, Austin, TX (United States)
  2. Univ. of Texas, Austin, TX (United States); Skolkovo Inst. of Science and Technology, Moscow (Russia)
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A high-resolution in situ spectroelectrochemical optical diffraction experiment has been created to understand the volume expansion/contraction process of amorphous silicon (a-Si) thin-film anodes. Electrodes consisting of 1D transmissive gratings of silicon have been produced through photolithographic methods. After glovebox assembly in a home-built Teflon cell, monitoring of the diffraction efficiency of these gratings during the lithiation/delithiation process is performed using an optical microscope equipped with a Bertrand lens. When the diffraction efficiency along with optical constants obtained from in situ spectroscopic ellipsometry is utilized, volume changes of the active materials can be deduced. Unlike transmission electron microscopy and atomic force microscopy characterization methods of observing silicon’s volume expansion, this experiment allows for real-time monitoring of the volume change at charge/discharge cycles greater than just the first few along with an experimental environment that directly mimics that of a real battery. This technique reflects promising results that provide needed insight into understanding the lithium alloying reaction and subsequent induced capacity fade during the cycling of alloying anodes in lithium-ion batteries.
Research Organization:
Energy Frontier Research Centers (EFRC) (United States). Understanding Charge Separation and Transfer at Interfaces in Energy Materials (CST)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Grant/Contract Number:
SC0001091
OSTI ID:
1370052
Journal Information:
ACS Applied Materials and Interfaces, Journal Name: ACS Applied Materials and Interfaces Journal Issue: 27 Vol. 8; ISSN 1944-8244
Publisher:
American Chemical Society (ACS)Copyright Statement
Country of Publication:
United States
Language:
English

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Cited By (1)

In situ and Operando Tracking of Microstructure and Volume Evolution of Silicon Electrodes by using Synchrotron X‐ray Imaging journal October 2018

Figures / Tables (8)

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Related Subjects

25 ENERGY STORAGE
amorphous silicon
lithium-ion batteries
optical diffraction
refractive index
silicon anode
spectroscopic ellipsometry
transmissive grating
volume expansion