Special Nuclear Material Characterization Using Digital 3-D Position Sensitive CdZnTe Detectors and High Purity Germanium Spectrometers
Journal Article
·
· IEEE Transactions on Nuclear Science
- Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences; Department of Nuclear Engineering and Radiological Sciences, University of Michigan
- Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences
Special nuclear material (SNM) monitoring often requires high resolution gamma-ray spectroscopy for material characterization. Portable systems and rapid deployment are also highly valued for some applications. Deployable gamma-ray imaging spectrometers using pixelated CdZnTe semiconductor detectors have become commercially available within the past three years to meet these requirements. CdZnTe systems have demonstrated room-temperature energy resolutions below 0.5% FWHM at 662 keV using single pixel events and below 0.7% FWHM at 662 keV using all events. The systems are able to go from storage to measurement in less than two minutes. Special nuclear materials were measured at the Y-12 National Security Complex and at the Device Assembly Facility at the Nevada National Security Site. The use of a CdZnTe system to measure uranium enrichment was demonstrated and uranium spectral features were compared to a commercially available high purity germanium (HPGe) spectrometer. Lastly, the use of passive gamma-ray spectroscopy techniques to estimate plutonium grade using CdZnTe detectors was demonstrated for the first time.
- Research Organization:
- Univ. of Michigan, Ann Arbor, MI (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation (NA-20)
- DOE Contract Number:
- NA0002534; NA0002131
- OSTI ID:
- 1367661
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 5 Vol. 63; ISSN 0018-9499
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
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