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Special Nuclear Material Characterization Using Digital 3-D Position Sensitive CdZnTe Detectors and High Purity Germanium Spectrometers

Journal Article · · IEEE Transactions on Nuclear Science
 [1];  [2];  [2];  [2];  [2]
  1. Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences; Department of Nuclear Engineering and Radiological Sciences, University of Michigan
  2. Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Nuclear Engineering and Radiological Sciences
Special nuclear material (SNM) monitoring often requires high resolution gamma-ray spectroscopy for material characterization. Portable systems and rapid deployment are also highly valued for some applications. Deployable gamma-ray imaging spectrometers using pixelated CdZnTe semiconductor detectors have become commercially available within the past three years to meet these requirements. CdZnTe systems have demonstrated room-temperature energy resolutions below 0.5% FWHM at 662 keV using single pixel events and below 0.7% FWHM at 662 keV using all events. The systems are able to go from storage to measurement in less than two minutes. Special nuclear materials were measured at the Y-12 National Security Complex and at the Device Assembly Facility at the Nevada National Security Site. The use of a CdZnTe system to measure uranium enrichment was demonstrated and uranium spectral features were compared to a commercially available high purity germanium (HPGe) spectrometer. Lastly, the use of passive gamma-ray spectroscopy techniques to estimate plutonium grade using CdZnTe detectors was demonstrated for the first time.
Research Organization:
Univ. of Michigan, Ann Arbor, MI (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Nonproliferation (NA-20)
DOE Contract Number:
NA0002534; NA0002131
OSTI ID:
1367661
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 5 Vol. 63; ISSN 0018-9499
Publisher:
IEEE
Country of Publication:
United States
Language:
English

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