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Title: Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/OE.24.024719· OSTI ID:1366469
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We propose a new approach to robustly retrieve the exit wave of an extended sample from its coherent diffraction pattern by exploiting sparsity of the sample's edges. This approach enables imaging of an extended sample with a single view, without ptychography. We introduce nonlinear optimization methods that promote sparsity, and we derive update rules to robustly recover the sample's exit wave. We test these methods on simulated samples by varying the sparsity of the edge-detected representation of the exit wave. Finally, our tests illustrate the strengths and limitations of the proposed method in imaging extended samples.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1366469
Journal Information:
Optics Express, Vol. 24, Issue 21; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science

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Cited By (2)

Identifying Defects with Guided Algorithms in Bragg Coherent Diffractive Imaging journal August 2017
Accurate, rapid identification of dislocation lines in coherent diffractive imaging via a min-max optimization formulation journal January 2018

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71 CLASSICAL AND QUANTUM MECHANICS
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Diffraction
Image reconstruction techniques
Inverse problems
Noise in imaging systems
X-ray imaging