Terahertz antireflection coating enabled by a subwavelength metallic mesh capped with a thin dielectric film

Journal Article · Wed Mar 30 00:00:00 EDT 2016 · Terahertz Science & Technology

DOI:https://doi.org/10.11906/TST.001-009.2016.03.01· OSTI ID:1364586

Huang, Li ^[1]; Chen, Hou -Tong ^[2]; Zeng, Beibei ^[2]; Chang, Chun -Chieh ^[2]

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1. Harbin Institute of Technology, Heilongjiang (China)
2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Metamaterials/metasurfaces have enabled unprecedented manipulation of electromagnetic waves. Here we present a new design of metasurface structure functioning as antireflection coatings. The structure consists of a subwavelength metallic mesh capped with a thin dielectric layer on top of a substrate. By tailoring the geometric parameters of the metallic mesh and the refractive index and thickness of the capping dielectric film, reflection from the substrate can be completely eliminated at a specific frequency. Compared to traditional methods such as coatings with single- or multi-layer dielectric films, the metasurface antireflection coatings are much thinner and the requirement of index matching is largely lifted. Here, this approach is particularly suitable for antireflection coatings in the technically challenging terahertz frequency range and is also applicable in other frequency regimes.

• Research Organization: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC52-06NA25396
• OSTI ID: 1364586
• Report Number(s): LA-UR--16-20538
• Journal Information: Terahertz Science & Technology, Journal Name: Terahertz Science & Technology Journal Issue: 1 Vol. 9; ISSN 1941-7411
• Publisher: Scinco, Inc
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
antireflection coatings
interference
material science
metasurfaces
terahertz