Ptychographic x-ray imaging of surfaces on crystal truncation rod

Zhu, Chenhui; Harder, Ross; Diaz, Ana; Komanicky, Vladimir; Barbour, Andi; Xu, Ruqing; Huang, Xiaojing; Liu, Yaohua; Pierce, Michael S.; Menzel, Andreas; You, Hoydoo

doi:10.1063/1.4914927

Title: Ptychographic x-ray imaging of surfaces on crystal truncation rod

Journal Article · Mon Mar 09 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4914927· OSTI ID:1356998

Zhu, Chenhui ^[1]; Harder, Ross ^[2]; Diaz, Ana ^[3]; Komanicky, Vladimir ^[4]; Barbour, Andi ^[2]; Xu, Ruqing ^[2]; Huang, Xiaojing ^[5];

^[2]; Pierce, Michael S. ^[6]; Menzel, Andreas ^[3];

^[2]

Argonne National Lab. (ANL), Argonne, IL (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)
Paul Scherrer Inst. (PSI), Villigen (Switzerland)
Safarik Univ., Kosice (Slovakia)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Rochester Inst. of Technology, Rochester, NY (United States)

Ptychography is a high-resolution imaging technique which does not require lenses for image magnification and which provides phase contrast with high sensitivity. Here we propose to use x-ray ptychography for the imaging of surface structure in crystalline samples. We show that ptychography can be used to image atomic structures using coherent diffraction patterns recorded along the crystal truncation rod of a crystal surface. In a proof-of-concept experiment on a Pt(111) sample, we present ptychographic reconstructions showing features consistent with surface steps. Furthermore, due to the penetration power of x-rays, this method could find interesting applications for the study of surface structures under buried interfaces or in harsh environments.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

Grant/Contract Number:: AC02-06CH11357; ITMS 26220120005

OSTI ID:: 1356998

Journal Information:: Applied Physics Letters, Vol. 106, Issue 10; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 9 works

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A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging Fevola, Giovanni; Bergbäck Knudsen, Erik; Ramos, Tiago Journal of Synchrotron Radiation, Vol. 27, Issue 1 https://doi.org/10.1107/s1600577519014425	journal	January 2020
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Dynamical effects in Bragg coherent x-ray diffraction imaging of finite crystals Shabalin, Anatoly; Yefanov, Oleksandr; Nosik, Valery Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-00334	text	January 2017
A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science Fam, Yakub; Sheppard, Thomas L.; Becher, Johannes International Union of Crystallography https://doi.org/10.5445/ir/1000099145	text	January 2019

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