3D lattice distortions and defect structures in ion-implanted nano-crystals

Hofmann, Felix; Robinson, Ian K.; Tarleton, Edmund; Harder, Ross J.; Phillips, Nicholas W.; Ma, Pui -Wai; Clark, Jesse N.; Abbey, Brian; Liu, Wenjun; Beck, Christian E.

doi:10.1038/srep45993

Title: 3D lattice distortions and defect structures in ion-implanted nano-crystals

Journal Article · Thu Apr 06 00:00:00 EDT 2017 · Scientific Reports

DOI:https://doi.org/10.1038/srep45993· OSTI ID:1349558

Hofmann, Felix ^[1]; Robinson, Ian K. ^[2]; Tarleton, Edmund ^[3]; Harder, Ross J. ^[4]; Phillips, Nicholas W. ^[5]; Ma, Pui -Wai ^[5]; Clark, Jesse N. ^[6]; Abbey, Brian ^[7]; Liu, Wenjun ^[4]; Beck, Christian E. ^[3]

Univ. of Oxford (United Kingdom). Dept. of Engineering Science
Univ. College, London (United Kingdom). London Centre for Nanotechnology; Science and Technology Facilities Council (STFC), Oxford (United Kingdom). Rutherford Appleton Lab. (RAL)
Univ. of Oxford (United Kingdom). Dept. of Materials
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source
La Trobe Univ., Melbourne, VIC (Australia). ARC Centre of Advanced Molecular Imaging; CSIRO Manufacturing Flagship, CAN Parkville (Australia)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany). Center for Free-Electron Laser Science
La Trobe Univ., Melbourne, VIC (Australia). ARC Centre of Advanced Molecular Imaging

Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across the life, earth and materials sciences. Despite its widespread usage, detailed understanding of the FIBinduced structural damage, intrinsic to the technique, remains elusive. Here we examine the defects caused by FIB in initially pristine objects. Using Bragg Coherent X-ray Diffraction Imaging (BCDI), we are able to spatially-resolve the full lattice strain tensor in FIB-milled gold nano-crystals. We find that every use of FIB causes large lattice distortions. Even very low ion doses, typical of FIB imaging and previously thought negligible, have a dramatic effect. Our results are consistent with a damage microstructure dominated by vacancies, highlighting the importance of free-surfaces in determining which defects are retained. At larger ion fluences, used during FIB-milling, we observe an extended dislocation network that causes stresses far beyond the bulk tensile strength of gold. These observations provide new fundamental insight into the nature of the damage created and the defects that lead to a surprisingly inhomogeneous morphology.

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States); Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC00112704; AC02-76SF00515; AC02-06CH11357

OSTI ID:: 1349558

Alternate ID(s):: OSTI ID: 1360215; OSTI ID: 1390607

Report Number(s):: BNL-113662-2017-JA; R&D Project: PO011; KC0201060

Journal Information:: Scientific Reports, Vol. 7; ISSN 2045-2322

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 80 works

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