Precision Control of the Electron Longitudinal Bunch Shape Using an Emittance-Exchange Beam Line
- POSTECH, Gyeongbuk (Republic of Korea)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Euclid TechLabs, Solon, OH (United States)
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Here, we report on the experimental generation of relativistic electron bunches with a tunable longitudinal bunch shape. A longitudinal bunch-shaping (LBS) beam line, consisting of a transverse mask followed by a transverse-to-longitudinal emittance exchange (EEX) beam line, is used to tailor the longitudinal bunch shape (or current profile) of the electron bunch. The mask shapes the bunch’s horizontal profile, and the EEX beam line converts it to a corresponding longitudinal profile. The Argonne wakefield accelerator rf photoinjector delivers electron bunches into a LBS beam line to generate a variety of longitudinal bunch shapes. The quality of the longitudinal bunch shape is limited by various perturbations in the exchange process. We develop a simple method, based on the incident slope of the bunch, to significantly suppress the perturbations.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- Pohang University of Science and Technology (POSTECH); Argonne National Laboratory, Advanced Photon Source; USDOE
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1393259
- Alternate ID(s):
- OSTI ID: 1346593
- Journal Information:
- Physical Review Letters, Vol. 118, Issue 10; ISSN 0031-9007
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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