Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells

Conference · Mon Nov 21 00:00:00 EST 2016

DOI:https://doi.org/10.1109/PVSC.2016.7750330· OSTI ID:1343484

Ding, Laura; Harvey, Stephen P.; Teeter, Glenn; Bertoni, Mariana I.

We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier-selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE)
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1343484
• Report Number(s): NREL/CP-5K00-67932
• Resource Relation: Conference: Presented at the 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 5-10 June 2016, Portland, Oregon
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
silicon solar cell
carrier-selective contact
operando
x-ray photoelectron spectroscopy