Bragg projection ptychography on niobium phase domain

Burdet, Nicolas; Shi, Xiaowen; Huang, Xiaojing; Clark, Jesse N.; Harder, Ross; Robinson, Ian K.

doi:10.1103/PhysRevB.96.014109

Title: Bragg projection ptychography on niobium phase domain

Journal Article · Wed Aug 10 00:00:00 EDT 2016 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.96.014109· OSTI ID:1340350

Burdet, Nicolas ^[1]; Shi, Xiaowen ^[2]; Huang, Xiaojing ^[3]; Clark, Jesse N. ^[4]; Harder, Ross ^[5]; Robinson, Ian K. ^[6]

Univ. College London, London (United Kingdom)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Advanced Photon Source, Argonne, IL (United States)
Univ. College London, London (United Kingdom); Research Complex at Harwell, Oxford (United Kingdom)

Here, we demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg “dark field” imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analyzed with the help of a careful combination of implemented refinement mechanisms.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC00112704; AC02-06CH11357; FG02-11ER46831; AC02-76SF00515; FG02-11DMR-9724294; EP/G068437/1; EP/I022562/1ER46831

OSTI ID:: 1340350

Alternate ID(s):: OSTI ID: 1371499; OSTI ID: 1374382

Report Number(s):: BNL-112069-2016-JA

Journal Information:: Physical Review B, Vol. 96, Issue 01; ISSN 2469-9950

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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References (36)

Phase retrieval with transverse translation diversity: a nonlinear optimization approach Guizar-Sicairos, Manuel; Fienup, James R. Optics Express, Vol. 16, Issue 10 https://doi.org/10.1364/OE.16.007264	journal	January 2008
Radiation-induced bending of silicon-on-insulator nanowires probed by coherent x-ray diffractive imaging Shi, Xiaowen; Xiong, Gang; Huang, Xiaojing New Journal of Physics, Vol. 14, Issue 6 https://doi.org/10.1088/1367-2630/14/6/063029	journal	June 2012
Parallel ptychographic reconstruction Nashed, Youssef S. G.; Vine, David J.; Peterka, Tom Optics Express, Vol. 22, Issue 26 https://doi.org/10.1364/OE.22.032082	journal	January 2014
Biological imaging by soft x-ray diffraction microscopy Shapiro, D.; Thibault, P.; Beetz, T. Proceedings of the National Academy of Sciences, Vol. 102, Issue 43 https://doi.org/10.1073/pnas.0503305102	journal	October 2005
The growth and structure of epitaxial niobium on sapphire Wildes, A. R.; Mayer, J.; Theis-Bröhl, K. Thin Solid Films, Vol. 401, Issue 1-2 https://doi.org/10.1016/S0040-6090(01)01631-5	journal	December 2001
A phase retrieval algorithm for shifting illumination Rodenburg, J. M.; Faulkner, H. M. L. Applied Physics Letters, Vol. 85, Issue 20 https://doi.org/10.1063/1.1823034	journal	November 2004
Reconstructing state mixtures from diffraction measurements Thibault, Pierre; Menzel, Andreas Nature, Vol. 494, Issue 7435 https://doi.org/10.1038/nature11806	journal	February 2013
X-ray scattering from misfit dislocations in heteroepitaxial films: The case of Nb(110) on Al2O3 Barabash, R. I.; Donner, W.; Dosch, H. Applied Physics Letters, Vol. 78, Issue 4 https://doi.org/10.1063/1.1342215	journal	January 2001
An improved ptychographical phase retrieval algorithm for diffractive imaging Maiden, Andrew M.; Rodenburg, John M. Ultramicroscopy, Vol. 109, Issue 10 https://doi.org/10.1016/j.ultramic.2009.05.012	journal	September 2009
Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens Suzuki, Akihiro; Shimomura, Kei; Hirose, Makoto Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep35060	journal	October 2016
Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens Miao, Jianwei; Charalambous, Pambos; Kirz, Janos Nature, Vol. 400, Issue 6742 https://doi.org/10.1038/22498	journal	July 1999
Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography Hruszkewycz, S. O.; Highland, M. J.; Holt, M. V. Physical Review Letters, Vol. 110, Issue 17, Article No. 177601 https://doi.org/10.1103/PhysRevLett.110.177601	journal	April 2013
Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography Chamard, V.; Allain, M.; Godard, P. Scientific Reports, Vol. 5, Issue 1 https://doi.org/10.1038/srep09827	journal	May 2015
Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography Holt, Martin V.; Hruszkewycz, Stephan O.; Murray, Conal E. Physical Review Letters, Vol. 112, Issue 16 https://doi.org/10.1103/PhysRevLett.112.165502	journal	April 2014
Efficient subpixel image registration algorithms Guizar-Sicairos, Manuel; Thurman, Samuel T.; Fienup, James R. Optics Letters, Vol. 33, Issue 2 https://doi.org/10.1364/OL.33.000156	journal	January 2008
High-throughput ptychography using Eiger-scanning X-ray nano-imaging of extended regions Guizar-Sicairos, Manuel; Johnson, Ian; Diaz, Ana Optics Express, Vol. 22, Issue 12 https://doi.org/10.1364/OE.22.014859	journal	January 2014
Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography Hruszkewycz, S. O.; Holt, M. V.; Murray, C. E. Nano Letters, Vol. 12, Issue 10 https://doi.org/10.1021/nl303201w	journal	September 2012
Strain Effects on the Crystal Growth and Superconducting Properties of Epitaxial Niobium Ultrathin Films Clavero, C.; Beringer, D. B.; Roach, W. M. Crystal Growth & Design, Vol. 12, Issue 5 https://doi.org/10.1021/cg3001834	journal	March 2012
High-resolution ab initio three-dimensional x-ray diffraction microscopy Chapman, Henry N.; Barty, Anton; Marchesini, Stefano Journal of the Optical Society of America A, Vol. 23, Issue 5 https://doi.org/10.1364/JOSAA.23.001179	journal	January 2006
Ptychographic coherent diffractive imaging with orthogonal probe relaxation Odstrcil, M.; Baksh, P.; Boden, S. A. Optics Express, Vol. 24, Issue 8 https://doi.org/10.1364/OE.24.008360	journal	January 2016
Evolutionary determination of experimental parameters for ptychographical imaging Shenfield, Alex; Rodenburg, John M. Journal of Applied Physics, Vol. 109, Issue 12 https://doi.org/10.1063/1.3600235	journal	June 2011
X-ray phase nanotomography through ptychographic coherent lensless imaging Guizar-Sicairos, Manuel; Diaz, Ana; Menzel, Andreas International Commission for Optics (ICO 22), SPIE Proceedings https://doi.org/10.1117/12.903688	conference	October 2011
High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography Hruszkewycz, S. O.; Allain, M.; Holt, M. V. Nature Materials, Vol. 16, Issue 2 https://doi.org/10.1038/nmat4798	journal	November 2016
Chemical composition mapping with nanometre resolution by soft X-ray microscopy Shapiro, David A.; Yu, Young-Sang; Tyliszczak, Tolek Nature Photonics, Vol. 8, Issue 10 https://doi.org/10.1038/nphoton.2014.207	journal	September 2014
An annealing algorithm to correct positioning errors in ptychography Maiden, A. M.; Humphry, M. J.; Sarahan, M. C. Ultramicroscopy, Vol. 120 https://doi.org/10.1016/j.ultramic.2012.06.001	journal	September 2012
High-resolution projection image reconstruction of thick objects by hard x-ray diffraction microscopy Takahashi, Yukio; Nishino, Yoshinori; Tsutsumi, Ryosuke Physical Review B, Vol. 82, Issue 21 https://doi.org/10.1103/PhysRevB.82.214102	journal	December 2010
Translation position determination in ptychographic coherent diffraction imaging Zhang, Fucai; Peterson, Isaac; Vila-Comamala, Joan Optics Express, Vol. 21, Issue 11 https://doi.org/10.1364/OE.21.013592	journal	January 2013
Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction Robinson, I. K.; Vartanyants, I. A.; Williams, G. J. Physical Review Letters, Vol. 87, Issue 19 https://doi.org/10.1103/PhysRevLett.87.195505	journal	October 2001
Commensurate and incommensurate structures in molecular beam epitaxially grown Ge _x Si ₁ _{− x} films on Si(100) Fiory, A. T.; Bean, J. C.; Feldman, L. C. Journal of Applied Physics, Vol. 56, Issue 4 https://doi.org/10.1063/1.334055	journal	August 1984
Three-dimensional high-resolution quantitative microscopy of extended crystals Godard, P.; Carbone, G.; Allain, M. Nature Communications, Vol. 2, Issue 1 https://doi.org/10.1038/ncomms1569	journal	September 2011
Nondestructive three-dimensional imaging of crystal strain and rotations in an extended bonded semiconductor heterostructure Pateras, A. I.; Allain, M.; Godard, P. Physical Review B, Vol. 92, Issue 20 https://doi.org/10.1103/PhysRevB.92.205305	journal	November 2015
Constraints on the growth of metallic superlattices Flynn, C. P. Journal of Physics F: Metal Physics, Vol. 18, Issue 9 https://doi.org/10.1088/0305-4608/18/9/005	journal	September 1988
Probe retrieval in ptychographic coherent diffractive imaging Thibault, Pierre; Dierolf, Martin; Bunk, Oliver Ultramicroscopy, Vol. 109, Issue 4 https://doi.org/10.1016/j.ultramic.2008.12.011	journal	March 2009
Coherent x-ray diffraction imaging of grown-in antiphase boundaries in ${Fe}_{65} {Al}_{35}$ Stadler, Lorenz-M.; Harder, Ross; Robinson, Ian K. Physical Review B, Vol. 76, Issue 1 https://doi.org/10.1103/PhysRevB.76.014204	journal	July 2007
Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films Hruszkewycz, S. O.; Zhang, Q.; Holt, M. V. Physical Review A, Vol. 94, Issue 4 https://doi.org/10.1103/PhysRevA.94.043803	journal	October 2016
Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction Pfeifer, M. A.; Pitney, J. A.; Robinson, I. K. The American Physical Society https://doi.org/10.17877/de290r-11299	text	January 2001

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