Spatial resolution of a spherical x-ray crystal spectrometer at various magnifications

Journal Article · Tue Aug 23 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4960066· OSTI ID:1340074

Gao, Lan ^[1]; Hill, K. W. ^[1]; Bitter, M. ^[1]; Efthimion, P. C. ^[1]; Delgado-Aparicio, L.  ^[1]; Pablant, N. A. ^[1]; Baronova, E. O. ^[2]; Pereira, N. R.  ^[3]

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1. Princeton Univ., Princeton, NJ (United States). Princeton Plasma Physics Lab.
2. NRC Kurchatov Institute, Moscow (Russia)
3. Ecopulse, Inc., Springfield, VA (United States)

Here, a high spatial resolution of a few μm is often required for probing small-scale high-energy-density plasmas using high resolution x-ray imaging spectroscopy. This resolution can be achieved by adjusting system magnification to overcome the inherent limitation of the detector pixel size. Laboratory experiments on investigating the relation between spatial resolution and system magnification for a spherical crystal spectrometer are presented. Tungsten Lβ₂ rays from a tungsten-target micro-focus x-ray tube were diffracted by a Ge 440 crystal, which was spherically bent to a radius of 223 mm, and imaged onto an x-ray CCD with 13-μm pixel size. The source-to-crystal (p) and crystal-to-detector (q) distances were varied to produce spatial magnifications (M = q/p) ranging from 2 to 10. The inferred instrumental spatial width reduces with increasing system magnification M. However, the experimental measurement at each M is larger than the theoretical value of pixel size divided by M. Future work will focus on investigating possible broadening mechanisms that limit the spatial resolution.

• Research Organization: Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
• Sponsoring Organization: USDOE
• Contributing Organization: NRC Kurchatov Institute, Moscow, Russia; Ecopulse, Inc., 7844 Vervain Ct., Springfield, Virginia 22152, USA
• Grant/Contract Number: AC02-09CH-11466
• OSTI ID: 1340074
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 11; Conference: 21st Topical Conference on High-Temperature Plasma Diagnostics , Madison, WI (United States), 5-9 Jun 2016; ISSN 0034-6748
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English

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