Dynamic crystal rotation resolved by high-speed synchrotron X-ray Laue diffraction

Journal Article · Wed Mar 30 00:00:00 EDT 2016 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/S160057751600223X· OSTI ID:1340004

Huang, J. W.; E, J. C.; Huang, J. Y.; Sun, T.; Fezzaa, K.; Luo, S. N.

Dynamic compression experiments are performed on single-crystal Si under split Hopkinson pressure bar loading, together with simultaneous high-speed (250–350 ns resolution) synchrotron X-ray Laue diffraction and phase-contrast imaging. A methodology is presented which determines crystal rotation parameters,i.e.instantaneous rotation axes and angles, from two unindexed Laue diffraction spots. Two-dimensional translation is obtained from dynamic imaging by a single camera. High-speed motion of crystals, including translation and rotation, can be tracked in real timeviasimultaneous imaging and diffraction.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Natural Science Foundation of China (NSFC)
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1340004
• Journal Information: Journal of Synchrotron Radiation (Online), Vol. 23, Issue 3; ISSN 1600-5775
• Publisher: International Union of Crystallography
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
synchrotron x-ray Laue diffraction
crystal rotation