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Sodium accumulation at potential-induced degradation shunted areas in polycrystalline silicon modules

Journal Article · · IEEE Journal of Photovoltaics
 [1];  [1];  [1];  [1];  [1];  [1]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
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Here, we investigated potential-induced degradation (PID) in silicon mini-modules that were subjected to accelerated stressing to induce PID conditions. Shunted areas on the cells were identified with photoluminescence and dark lock-in thermography (DLIT) imaging. The identical shunted areas were then analyzed via time-of-flight secondary-ion mass spectrometry (TOFSIMS) imaging, 3-D tomography, and high-resolution transmission electron microscopy. The TOF-SIMS imaging indicates a high concentration of sodium in the shunted areas, and 3-D tomography reveals that the sodium extends more than 2 um from the surface below shunted regions. Transmission electron microscopy investigation reveals that a stacking fault is present at an area identified as shunted by DLIT imaging. After the removal of surface sodium, tomography reveals persistent sodium present around the junction depth of 300 nm and a drastic difference in sodium content at the junction when comparing shunted and nonshunted regions.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1339517
Report Number(s):
NREL/JA--5K00-65733
Journal Information:
IEEE Journal of Photovoltaics, Journal Name: IEEE Journal of Photovoltaics Journal Issue: 6 Vol. 6; ISSN 2156-3381
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

Cited By (5)

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Investigating PID shunting in polycrystalline silicon modules via multiscale, multitechnique characterization journal February 2018
One-type-fits-all-systems: Strategies for preventing potential-induced degradation in crystalline silicon solar photovoltaic modules
  • Virtuani, Alessandro; Annigoni, Eleonora; Ballif, Christophe
  • Progress in Photovoltaics: Research and Applications, Vol. 27, Issue 1 https://doi.org/10.1002/pip.3066
journal July 2018
Potential-induced degradation in photovoltaic modules: a critical review journal January 2017
Regular and Irregular Performance Variation of Module String and Occurred Conditions for Potential Induced Degradation-Affected Crystalline Silicon Photovoltaic Power Plants journal November 2019

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Related Subjects

14 SOLAR ENERGY
3-D tomography
36 MATERIALS SCIENCE
accelerated stress
dark lock-in thermography (DLIT)
degradation
polycrystalline silicon modules
potential-induced degradation (PID)
shunting
silicon
silicon compounds
sodium
spectrometry (TOF-SIMS)
time-of-flight secondary-ion mass
tomography