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Title: In situ defect annealing of swift heavy ion irradiated CeO 2 and ThO 2 using synchrotron X-ray diffraction and a hydrothermal diamond anvil cell

Abstract

Hydrothermal diamond anvil cells (HDACs) provide facile means for coupling synchrotron Xray techniques with pressure up to 10 GPa and temperature up to 1300 K. This manuscript reports on an application of the HDAC as an ambient-pressure sample environment for performing in situ defect annealing and thermal expansion studies of swift heavy ion irradiated CeO 2 and ThO 2 using synchrotron X-ray diffraction. The advantages of the in situ HDAC technique over conventional annealing methods include: rapid temperature ramping and quench times, high-resolution measurement capability, simultaneous annealing of multiple samples, and prolonged temperature- and apparatus stability at high temperatures. Isochronal annealing between 300 K and 1100 K revealed 2-stage and 1-stage defect recovery processes for irradiated CeO 2 and ThO 2, respectively; indicating that the morphology of the defects produced by swift heavy ion irradiation of these two materials differs significantly. These results suggest that electronic configuration plays a major role in both the radiation-induced defect production and high temperature defect recovery mechanisms of CeO 2 and ThO 2.

Authors:
 [1];  [2];  [2];  [3];  [3];  [4];  [5];  [1]
  1. Univ. of Tennessee, Knoxville, TN (United States)
  2. Univ. of Michigan, Ann Arbor, MI (United States)
  3. Carnegie Inst. of Washington, Argonne, IL (United States). Geophysical Lab.
  4. Technische Univ. Darmstadt (Germany); GSI-Darmstadt (Germany)
  5. Stanford Univ., CA (United States)
Publication Date:
Research Org.:
Carnegie Inst. of Science, Argonne, IL (United States); Energy Frontier Research Centers (EFRC) (United States). Materials Science of Actinides (MSA)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1338330
Grant/Contract Number:  
NA0002006; SC0001089
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Volume: 48; Journal Issue: 3; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ion irradiation; actinides; oxides; diffraction; annealing; diamond anvil cell

Citation Formats

Palomares, Raul I., Tracy, Cameron L., Zhang, Fuxiang, Park, Changyong, Popov, Dmitry, Trautmann, Christina, Ewing, Rodney C., and Lang, Maik. In situ defect annealing of swift heavy ion irradiated CeO 2 and ThO 2 using synchrotron X-ray diffraction and a hydrothermal diamond anvil cell. United States: N. p., 2015. Web. doi:10.1107/S160057671500477X.
Palomares, Raul I., Tracy, Cameron L., Zhang, Fuxiang, Park, Changyong, Popov, Dmitry, Trautmann, Christina, Ewing, Rodney C., & Lang, Maik. In situ defect annealing of swift heavy ion irradiated CeO 2 and ThO 2 using synchrotron X-ray diffraction and a hydrothermal diamond anvil cell. United States. doi:10.1107/S160057671500477X.
Palomares, Raul I., Tracy, Cameron L., Zhang, Fuxiang, Park, Changyong, Popov, Dmitry, Trautmann, Christina, Ewing, Rodney C., and Lang, Maik. Thu . "In situ defect annealing of swift heavy ion irradiated CeO 2 and ThO 2 using synchrotron X-ray diffraction and a hydrothermal diamond anvil cell". United States. doi:10.1107/S160057671500477X. https://www.osti.gov/servlets/purl/1338330.
@article{osti_1338330,
title = {In situ defect annealing of swift heavy ion irradiated CeO 2 and ThO 2 using synchrotron X-ray diffraction and a hydrothermal diamond anvil cell},
author = {Palomares, Raul I. and Tracy, Cameron L. and Zhang, Fuxiang and Park, Changyong and Popov, Dmitry and Trautmann, Christina and Ewing, Rodney C. and Lang, Maik},
abstractNote = {Hydrothermal diamond anvil cells (HDACs) provide facile means for coupling synchrotron Xray techniques with pressure up to 10 GPa and temperature up to 1300 K. This manuscript reports on an application of the HDAC as an ambient-pressure sample environment for performing in situ defect annealing and thermal expansion studies of swift heavy ion irradiated CeO2 and ThO2 using synchrotron X-ray diffraction. The advantages of the in situ HDAC technique over conventional annealing methods include: rapid temperature ramping and quench times, high-resolution measurement capability, simultaneous annealing of multiple samples, and prolonged temperature- and apparatus stability at high temperatures. Isochronal annealing between 300 K and 1100 K revealed 2-stage and 1-stage defect recovery processes for irradiated CeO2 and ThO2, respectively; indicating that the morphology of the defects produced by swift heavy ion irradiation of these two materials differs significantly. These results suggest that electronic configuration plays a major role in both the radiation-induced defect production and high temperature defect recovery mechanisms of CeO2 and ThO2.},
doi = {10.1107/S160057671500477X},
journal = {Journal of Applied Crystallography (Online)},
issn = {1600-5767},
number = 3,
volume = 48,
place = {United States},
year = {2015},
month = {4}
}

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